English
Related papers

Related papers: Quantifying work function differences using low-en…

200 papers

We recast the Howie-Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows very rapid computation of simulated…

Materials Science · Physics 2024-09-04 D. R. Mason , M. Boleininger , J. Haley , E. Prestat , G. He , F. Hofmann , S. L. Dudarev

Rare-earth monopnictides have attracted much attention due to their unusual electronic and topological properties for potential device applications. Here, we study rock-salt structured lanthanum monopnictides LaX (X = P, As) by density…

Materials Science · Physics 2021-09-08 Chia-Min Lin , Wei-Chih Chen , Cheng-Chien Chen

Energy efficient, safe and reliable Li-ion batteries (LIBs) are required for a wide range of applications. Charging capabilities of thick electrodes still holding their stored high-energy is a most desirable characteristic in future…

With full knowledge of a material's atomistic structure, it is possible to predict any macroscopic property of interest. In practice, this is hindered by limitations of the chosen characterisation techniques. For example, electron…

The optoelectronic properties of nanoscale systems such as carbon nanotubes (CNTs), graphene nanoribbons and transition metal dichalcogenides (TMDCs) are determined by their dielectric function. This complex, frequency dependent function is…

Materials Science · Physics 2021-11-10 Oisín Garrity , Alvaro Rodriguez , Niclas S. Mueller , Otakar Frank , Patryk Kusch

Lorentz transmission electron microscopy is a unique characterization technique that enables the simultaneous imaging of both the microstructure and functional properties of materials at high spatial resolution. The quantitative information…

Materials Science · Physics 2020-12-09 Tao Zhou , Mathew Cherukara , Charudatta Phatak

(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of devices due to its time-intensive…

We present a computationally efficient method to incorporate density-functional theory into the calculation of reflectivity in low-energy electron microscopy. The reflectivity is determined by matching plane waves representing the electron…

Materials Science · Physics 2013-11-13 John F. McClain , Jiebing Sun , Karsten Pohl , Jian-Ming Tang

Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…

Instrumentation and Detectors · Physics 2022-07-27 Frances Quigley , Patrick McBean , Peter O'Donovan , Jonathan J. P. Peters , Lewys Jones

The PTOLEMY transverse drift filter is a new concept to enable precision analysis of the energy spectrum of electrons near the tritium beta-decay endpoint. This paper details the implementation and optimization methods for successful…

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

Various new phenomena emerge in quantum materials under elastic deformations, such as hydrostatic or uniaxial stresses. In particular, using uniaxial strain or stress can help to tune or uncover specific structural or electronic orders in…

Applied Physics · Physics 2019-12-30 Donovan Davino , Jacob Franklin , Ilya Sochnikov

Perovskite SrVO$_3$ has recently been proposed as a novel electron emission cathode material. Density functional theory (DFT) calculations suggest multiple low work function surfaces and recent experimental efforts have consistently…

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave. Using a fiber interferometer, we found that the strain changes sign across the…

Applied Physics · Physics 2018-07-25 M. Wang , S. Wang , Q. Zhang , C. T. Chan , H. B. Chan

The development of novel functional materials in experimental labs combined with computer-based compound simulation brings the vision of materials design on a microscopic scale continuously closer to reality. For many applications interface…

Materials Science · Physics 2016-06-09 Zhicheng Zhong , Philipp Hansmann

Li metal has been deposited on the surface of a Ru(0001) single crystal containing patches of monolayer-thick epitaxial graphene islands. The use of low-energy electron microscopy and diffraction allowed us to {\em in situ} monitor the…

We report variation of the work function for single and bi-layer graphene devices measured by scanning Kelvin probe microscopy (SKPM). Using the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes…

Mesoscale and Nanoscale Physics · Physics 2015-05-14 Young-Jun Yu , Yue Zhao , Sunmin Ryu , Louis E. Brus , Kwang S. Kim , Philip Kim

The advent of milli-kelvin scanning tunneling microscopes (STM) with inbuilt magnetic fields has opened access to the study of magnetic phenomena with atomic resolution at surfaces. In the case of single atoms adsorbed on a surface, the…

Mesoscale and Nanoscale Physics · Physics 2012-06-19 Jean-Pierre Gauyacq , Nicolas Lorente , Frederico Dutilh Novaes

The coexistence of different ferroelectric phases enables the tunability of the macroscopic properties and extensive applications from piezoelectric transducers to nonvolatile memories. Here we develop a thermodynamic model to predict the…

Materials Science · Physics 2022-01-26 Yang Zhang , Fei Xue , Bo Wang , Jia-Mian Hu , Shuai Dong , Jun-Ming Liu , Long-Qing Chen