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The development of large-area homogeneous photo-detectors with sub-millimeter path lengths for direct Cherenkov light and for secondary-electrons opens the possibility of large time-of-flight systems for relativistic particles with…

Instrumentation and Detectors · Physics 2009-08-05 Jean-Francois Genat , Gary Varner , Fukun Tang , Henry Frisch

Convex optimization recently emerges as a compelling framework for performing super resolution, garnering significant attention from multiple communities spanning signal processing, applied mathematics, and optimization. This article offers…

Signal Processing · Electrical Eng. & Systems 2020-04-22 Yuejie Chi , Maxime Ferreira Da Costa

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

Materials Science · Physics 2007-05-23 Franz-Josef Elmer

We report the optical imaging of a single atom with nanometer resolution using an adaptive optical alignment technique that is applicable to general optical microscopy. By decomposing the image of a single laser-cooled atom, we identify and…

Atomic Physics · Physics 2016-09-21 J. D. Wong-Campos , K. G. Johnson , B. Neyenhuis , J. Mizrahi , C. Monroe

Super-resolution is generally referred to as the task of recovering fine details from coarse information. Motivated by applications such as single-molecule imaging, radar imaging, etc., we consider parameter estimation of complex…

Information Theory · Computer Science 2016-08-10 Dehui Yang , Gongguo Tang , Michael B. Wakin

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

Materials Science · Physics 2025-09-03 Jie Huang , Niko Oinonen , Fabio Priante , Filippo Federici Canova , Lauri Kurki , Chen Xu , Adam S. Foster

Metal-organic framework (MOF) thin-films show unmatched promise as smart membranes and photo-catalytic coatings. However, their nucleation and growth resulting from intricate molecular assembly processes are not well understood, yet crucial…

Modern PET systems reach a spatial resolution of 3-10 mm. A disadvantage of this technique is the diffusion of the positron before its decay with a typical range of ca. 1 mm (depending on its energy). This motion and Compton scattering of…

Instrumentation and Detectors · Physics 2012-02-03 C. Lang , D. Habs , P. G. Thirolf , A. Zoglauer

We demonstrate the fabrication of sharp nanopillars of high aspect ratio onto specialized atomic force microscopy (AFM) microcantilevers and their use for high-speed AFM of DNA and nucleoproteins in liquid. The fabrication technique uses…

Biomolecules · Quantitative Biology 2023-11-07 Frances I. Allen , José María De Teresa , Bibiana Onoa

We present first-principles total-energy electronic-structure calculations that provide the microscopic mechanism of the Ag atom diffusion between the half unit cells (HUCs) on the Si(111)-(7x7) surface with and without the tip of the…

Materials Science · Physics 2017-02-08 Batnyam Enkhtaivan , Atsushi Oshiyama

Understanding 3D fundamental processes is crucial for academic and industrial applications. Nowadays, X-ray time-resolved tomography, or tomoscopy, is a leading technique for in-situ and operando 4D (3D+time) characterization. Despite its…

Ridge detection is a classical tool to extract curvilinear features in image processing. As such, it has great promise in applications to material science problems; specifically, for trend filtering relatively stable atom-shaped objects in…

Applications · Statistics 2025-02-18 Yuchen Xu , Andrew M. Thomas , Peter A. Crozier , David S. Matteson

Atomic resolution imaging is key to understanding thin film growth and how a particular set of conditions influences properties. Whilst such imaging in the scanning transmission electron microscope (STEM) has had transformative impact in…

Hybrid pixel detectors have a well-established array of applications ranging from particle physics to life sciences. The small dimensions of Timepix3 as well as its relatively low energetic expenses make it an intriguing option additionally…

Instrumentation and Detectors · Physics 2025-09-10 Radu-Emanuel Mihai , Benedikt Bergmann , Petr Smolyanskiy

Ultimately, brittle fracture involves breaking atomic bonds. However, we still lack a clear picture of what happens in the highly deformed region around a moving crack tip. Consequently, we still cannot link nano to atomic-scale phenomena…

Materials Science · Physics 2024-07-22 Oriol Gavalda-Diaz , Max Emmanuel , Katharina Marquardt , Eduardo Saiz , Finn Giuliani

Based on image encoding in a serial-temporal format, optical time-stretch imaging entails a stringent requirement of state-of-the- art fast data acquisition unit in order to preserve high image resolution at an ultrahigh frame rate ---…

Instrumentation and Detectors · Physics 2017-03-29 Antony C. S. Chan , Ho-Cheung Ng , Sharat C. V. Bogaraju , Hayden K. H. So , Edmund Y. Lam , Kevin K. Tsia

The determination of relative stopping power (RSP) via proton computed tomography (pCT) of a patient is dependent in part on the knowledge of the incoming proton kinetic energies; the uncertainty in these energies is in turn determined by…

This paper presents a comprehensive numerical analysis of super-resolution imaging using dielectric microparticles, employing the Finite-Difference Time-Domain (FDTD) method to elucidate the mechanisms that enable resolution enhancements…

Optics · Physics 2024-09-18 Arlen Bekirov , Zengbo Wang , Boris Lukyanchuk

Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…

Materials Science · Physics 2020-12-16 Peter Moeck