Ridge detection is a classical tool to extract curvilinear features in image processing. As such, it has great promise in applications to material science problems; specifically, for trend filtering relatively stable atom-shaped objects in image sequences, such as Transmission Electron Microscopy (TEM) videos. Standard analysis of TEM videos is limited to frame-by-frame object recognition. We instead harness temporal correlation across frames through simultaneous analysis of long image sequences, specified as a spatio-temporal image tensor. We define new ridge detection algorithms to non-parametrically estimate explicit trajectories of atomic-level object locations as a continuous function of time. Our approach is specially tailored to handle temporal analysis of objects that seemingly stochastically disappear and subsequently reappear throughout a sequence. We demonstrate that the proposed method is highly effective and efficient in simulation scenarios, and delivers notable performance improvements in TEM experiments compared to other material science benchmarks.
Cite
@article{arxiv.2302.00816,
title = {Dynamic Atomic Column Detection in Transmission Electron Microscopy Videos via Ridge Estimation},
author = {Yuchen Xu and Andrew M. Thomas and Peter A. Crozier and David S. Matteson},
journal= {arXiv preprint arXiv:2302.00816},
year = {2025}
}