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We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called…

A custom double-lamella method is presented for electrochemically etching tungsten wire for use as tips in scanning tunneling microscopy (STM). For comparison, tips were also manufactured in-house using numerous conventional methods and…

Mesoscale and Nanoscale Physics · Physics 2015-02-06 J. K. Schoelz , P. Xu , S. D. Barber , D. Qi , M. L. Ackerman , G. Basnet , C. T. Cook , P. M. Thibado

A novel approach to improving the performances of confocal scanning imaging is proposed. We experimentally demonstrate its feasibility using acoustic waves. It relies on a new way to encode spatial information using the temporal dimension.…

While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…

Mesoscale and Nanoscale Physics · Physics 2015-06-12 Sergio Santos , Victor Barcons , Josep Font , Neil H Thomson

Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…

Applied Physics · Physics 2020-07-31 M. Chighizola , L. Puricelli , L. Bellon , A. Podestà

We present an advanced scanning probe microscopy system enhanced with artificial intelligence (AI-SPM) designed for self-driving atomic-scale measurements. This system expertly identifies and manipulates atomic positions with high…

Computational Physics · Physics 2024-04-18 Zhuo Diao , Keiichi Ueda , Linfeng Hou , Fengxuan Li , Hayato Yamashita , Masayuki Abe

This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep…

Data Analysis, Statistics and Probability · Physics 2018-09-12 Y. Liu , Q. M. Sun , Dr. W. H. Lu , Dr. H. L. Wang , Y. Sun , Z. T. Wang , X. Lu , Prof. K. Y. Zeng

In atomic force microscopy (AFM) tip-surface interactions are usually considered as functions of the tip position only, so-called force curves. However, tip-surface interactions often depend on the tip velocity and the past tip trajectory.…

Mesoscale and Nanoscale Physics · Physics 2013-01-31 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

We consider the problem of reconstructing a nanocrystal at atomic resolution from electron microscopy images taken at a few tilt angles. A popular reconstruction approach called discrete tomography confines the atom locations to a coarse…

Numerical Analysis · Mathematics 2020-07-15 Poulami Somanya Ganguly , Felix Lucka , Hermen Jan Hupkes , Kees Joost Batenburg

We present feasibility study of an accelerator-based ultrafast transmission electron microscope (u-TEM) capable of producing a full field image in a single-shot with simultaneous picosecond temporal resolution and nanometer spatial…

Accelerator Physics · Physics 2014-06-11 D. Xiang , F. Fu , J. Zhang , X. Huang , L. Wang , X. Wang , W. Wan

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…

Mesoscale and Nanoscale Physics · Physics 2009-11-13 A. E. Gildemeister , T. Ihn , M. Sigrist , K. Ensslin , D. C. Driscoll , A. C. Gossard

We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the…

Materials Science · Physics 2007-05-23 Franz J. Giessibl

The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most…

We report the fabrication and the characterization of carbon fibre tips for their use in combined scanning tunnelling and force microscopy based on piezoelectric quartz tuning fork force sensors. We find that the use of carbon fibre tips…

Mesoscale and Nanoscale Physics · Physics 2010-03-15 Andres Castellanos-Gomez , Nicolas Agraït , Gabino Rubio-Bollinger

Mid-infrared photothermal microscopy is a highly promising imaging technique that enables spatially resolved vibrational fingerprinting. The combination of infrared induced heating with optical readout at visible wavelengths provides…

Optics · Physics 2025-08-05 Dennis van de Lockand , Daan Wolters , Matz Liebel

Atomic-scale characterization of spin textures in solids is essential for understanding and tuning properties of magnetic materials and devices. While high-energy electrons are employed for atomic-scale imaging of materials, they are…

Materials Science · Physics 2023-12-29 Jizhe Cui , Haozhi Sha , Wenfeng Yang , Rong Yu

Imaging across both the full transverse spatial and temporal dimensions of a scene with high precision in all three coordinates is key to applications ranging from LIDAR to fluorescence lifetime imaging. However, compromises that sacrifice,…

Image and Video Processing · Electrical Eng. & Systems 2021-01-12 C. Callenberg , A. Lyons , D. den Brok , A. Fatima , A. Turpin , V. Zickus , L. Machesky , J. Whitelaw , D. Faccio , M. B. Hullin

Two-dimensional (2D) materials beyond graphene such as transition metal dichalcogenides (TMDs) have unique mechanical, optical and electronic properties with promising applications in flexible devices, catalysis and sensing. Optical imaging…

Analyzing atomically resolved images is a time-consuming process requiring solid experience and substantial human intervention. In addition, the acquired images contain a large amount of information such as crystal structure, presence and…