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Atom probe tomography (APT) is often quoted to provide "atomic-scale" analysis of materials in three dimensions. Despite efforts to quantify APT's spatial resolution, misunderstanding remain regarding its true spatial performance. If the…

CO-terminated tips currently provide the best spatial resolution obtainable in atomic force microscopy. Due to their chemical inertness, they allow to probe interactions dominated by Pauli repulsion. The small size and inertness of the…

Mesoscale and Nanoscale Physics · Physics 2018-11-14 Julian Berwanger , Ferdinand Huber , Fabian Stilp , Franz J. Giessibl

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…

Mesoscale and Nanoscale Physics · Physics 2012-08-07 William Paul , Yoichi Miyahara , Peter Grütter

Tip functionalization in AFM allows imaging organic nano-structures with sub-molecular resolution. Here, recent progress by using atomically defined copper-oxide tips is discussed. With their outstanding rigidity and elemental selectivity…

Materials Science · Physics 2025-10-22 Harry Mönig

Nanoparticle surface structural dynamics is believed to play a significant role in regulating functionalities such as diffusion, reactivity, and catalysis but the atomic-level processes are not well understood. Atomic resolution…

High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

Mesoscale and Nanoscale Physics · Physics 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…

Instrumentation and Detectors · Physics 2007-05-23 P. Fraundorf , J. Tentschert

This article addresses gaps in definitions and a lack of standard measurement techniques to assess the spatial resolution in atom probe tomography. This resolution is known to be anisotropic, being better in the depth than laterally.…

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

Materials Science · Physics 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

In this paper, a method for increasing the temporal resolution of a temporal imaging system has been developed. Analogously to the conventional spatial imaging systems in which resolution limit is due to the finite aperture of the lens, in…

Optics · Physics 2020-04-22 Farshid Shateri , Mehdi Hosseinalizadeh , Zahra Kavehvash

Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local…

Atomic resolution imaging is demonstrated using a hybrid scanning tunneling/near-field microwave microscope (microwave-STM). The microwave channels of the microscope correspond to the resonant frequency and quality factor of a coaxial…

Mesoscale and Nanoscale Physics · Physics 2011-08-16 Jonghee Lee , Christian J. Long , Haitao Yang , Xiao-Dong Xiang , Ichiro Takeuchi

To achieve atomic-level characterization of the diamond (001) surface, persistent efforts have been made over the past few decades. The motivation behind the pursuit extends beyond investigating surface defects and adsorbates; it also…

Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved…

Mesoscale and Nanoscale Physics · Physics 2017-12-11 Sumit Tewari , Koen M. Bastiaans , Milan P. Allan , Jan M. van Ruitenbeek

IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…

Advancing temporal resolution in computation, signal modulation, and measurement is crucial for pushing the frontiers of modern science and technology. Optical resonators have recently demonstrated computational operations at frequencies…

Optics · Physics 2025-10-31 Asaf Farhi

Scanning tunnelling microscopy (STM) enables atomic-resolution imaging and atom manipulation, but its utility is often limited by tip degradation and slow serial data acquisition. Fabrication adds another layer of complexity since the tip…

Computer Vision and Pattern Recognition · Computer Science 2025-10-31 Nikola L. Kolev , Tommaso Rodani , Neil J. Curson , Taylor J. Z. Stock , Alberto Cazzaniga

Atomic time scale imaging, opening a new era for studying dynamics in microcosmos, is presently attracting immense research interesting on the global level due to its powerful ability. On the atom level, physics, chemistry, and biology are…

Optics · Physics 2023-10-19 Jingzhen Li , Yi Cai , Xuanke Zeng , Xiaowei Lu , Qifan Zhu , Yongle Zhu

A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…

Signal Processing · Electrical Eng. & Systems 2019-02-13 Kaixiang Wang , Michael G. Ruppert , Chris Manzie , Dragan Nesic , Yuen K. Yong

The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy (SPM) was fabricated by amplitude-modulated alternating-current (AC) electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly…

Materials Science · Physics 2025-02-18 Yuto Nishiwaki , Toru Utsunomiya , Shu Kurokawa , Takashi Ichii
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