Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, the control of the atomic-scale shape of STM tips remains a poorly solved problem. Here, we present a method for preparing tips {\it in-situ} and for ensuring the crystalline structure and reproducibly preparing tip structure up to the second atomic layer. We demonstrate a controlled evolution of such tips starting from undefined tip shapes.
@article{arxiv.1705.08796,
title = {Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips},
author = {Sumit Tewari and Koen M. Bastiaans and Milan P. Allan and Jan M. van Ruitenbeek},
journal= {arXiv preprint arXiv:1705.08796},
year = {2017}
}