Related papers: Three-dimensional force-field microscopy with opti…
A high sensitivity force sensor based on dielectric microspheres in vacuum, optically trapped by a single, upward-propagating laser beam, is described. Off-axis parabolic mirrors are used both to focus the 1064~nm trapping beam and to…
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…
Numerous cell types relate to their immediate environment by exerting a three-dimensional pressure field on their environment, with components both longitudinal and transverse to the cell membrane. This pressure field can in principle be…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
We propose an experiment using optically trapped and cooled dielectric microspheres for the detection of short-range forces. The center-of-mass motion of a microsphere trapped in vacuum can experience extremely low dissipation and quality…
We report an $\textit{in situ}$ mass measurement of approximately-$4.7{\text -}\mu$m-diameter, optically levitated microspheres with an electrostatic co-levitation technique. The mass of a trapped, charged microsphere is measured by holding…
This study presents a novel, versatile traction force microscopy framework for quantifying three-dimensional (3D) interfacial forces during bio-adhesion by integrating in situ stereo digital image correlation with finite element (FE)…
Levitated optomechanics is showing potential for precise force measurements. Here, we report a case study, to show experimentally the capacity of such a force sensor. Using an electric field as a tool to detect a Coulomb force applied onto…
The center-of-mass motion of optically trapped dielectric nanoparticles in vacuum is extremely well-decoupled from its environment, making a powerful tool for measurements of feeble sub-attonewton forces. We demonstrate a method to trap and…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
We describe the implementation of laser-cooled silica microspheres as force sensors in a dual-beam optical dipole trap in high vacuum. Using this system we have demonstrated trap lifetimes exceeding several days, attonewton force detection…
We report on a search for non-Newtonian forces that couple to mass, with a characteristic scale of ${\sim}10~\mu$m, using an optically levitated microsphere as a precision force sensor. A silica microsphere trapped in an upward-propagating,…
A force measurement technique has been developed that utilizes a clamped fiber optic element both as a cantilever and as a highly sensitive probe of the static and dynamic displacement of a sample that is mounted near its free end. Light…
Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with…
Three-dimensional atomic force microscopy (3D-AFM) has been a powerful tool to probe the atomic-scale structure of solid-liquid interfaces. As a nanoprobe moves along the 3D volume of interfacial liquid, the probe-sample interaction force…
Optically levitated macroscopic objects are a powerful tool in the field of force sensing, owing to high sensitivity, absolute force calibration, environmental isolation and the advanced degree of control over their dynamics that have been…
The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…