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Two-level modeling for nanoscale pattern formation on silicon target by Ar$^+$ ion sputtering is presented. Phase diagram illustrating possible nanosize surface patterns is discussed. Scaling characteristics for the structure wavelength…

Materials Science · Physics 2011-07-01 V. O. Kharchenko , D. O. Kharchenko

We present new atomistic models of amorphous silicon (a-Si) and hydrogenated amorphous silicon (a-Si:H) surfaces. The a-Si model included 4096 atoms and was obtained using local orbital density functional theory. By analyzing a slab model…

Materials Science · Physics 2025-06-24 Kishor Nepal , Aashish Gautam , Chinonso Ugwumadu , David Drabold

Non-ionising energy loss of radiation produces point defects and defect clusters in silicon, which result in a signifcant degradation of sensor performance. In this contribution results from TSC (Thermally Stimulated Current) defect…

Diffusion mediated interaction in metal-substrate assembly during high temperature annealing leads to possible formation of new composite materials. Here, sputtered grown Ti films on Si3N4/Si substrate has been reported to produce titanium…

Materials Science · Physics 2020-11-19 Sachin Yadav , Sangeeta Sahoo

Transmission electron microscopy (TEM) study on morphological changes in gold nanostructures deposited on Si (100) upon annealing under different vacuum conditions has been reported. Au thin films of thickness ~2.0 nm were deposited under…

Mesoscale and Nanoscale Physics · Physics 2017-12-06 Ashutosh Rath , R. R. Juluri , P. V. Satyam

We present a computational study of the electronic properties of amorphous SiO2. The ionic configurations used are the ones generated by an earlier molecular dynamics simulations in which the system was cooled with different cooling rates…

Disordered Systems and Neural Networks · Physics 2009-10-30 Thorsten Koslowski , Walter Kob , Katharina Vollmayr

Compact layers containing embedded semiconductor particles consolidated using pulsed electric current sintering exhibit intense, broadband near-infrared reflectance. The composites consolidated from nano- or micro-silica powder have a…

Nano--metal/semiconductor junction dependent porosification of silicon (Si) has been studied here. The silicon (Si) nanostructures (NS) have been textured on n-- and p-- type silicon wafers using Ag and Au metal nano particles induced…

Mesoscale and Nanoscale Physics · Physics 2017-05-09 Priyanka Yogi , Deepika Poonia , Suryakant Mishra , Shailendra K. Saxena , Swarup Roy , Pankaj R Sagdeo , Rajesh Kumar

Pattern formation induced by wrinkling is a very common phenomenon exhibited in soft-matter substrates. In all these systems wrinkles develop in presence of compressively stressed thin films lying on compliant substrates. Here we…

Mesoscale and Nanoscale Physics · Physics 2019-03-26 Maria Caterina Giordano , Francesco Buatier de Mongeot

This proceeding discusses the impact of XUV/X-ray irradiation on materials, and how their response is affected by temperature, size, and structure. When materials are exposed to intense XUV/X-ray irradiation, they undergo a series of…

Materials Science · Physics 2023-11-10 Nikita Medvedev

We present a joint experimental and theoretical study of the superconducting phase of the layered binary silicide BaSi2. Compared with the layered AlB2 structure of graphite or diboride-like superconductors, in the hexagonal structure of…

The structure of a simple liquid may be characterised in terms of ground state clusters of small numbers of atoms of that same liquid. Here we use this sensitive structural probe to consider the effect of a liquid-vapour interface upon the…

Soft Condensed Matter · Physics 2011-06-02 Maia Godonoga , Alex Malins , Jens Eggers , C. Patrick Royall

This paper presents the experimental results on research of growth processes of GaAs layers on silicon substrates by molecular beam epitaxy. The formation of buffer Si layer in a single growth process has been found to significantly improve…

Electron-beam (e-beam) lithography is commonly used in fabricating metal-oxide-silicon (MOS) quantum devices but creates defects at the Si/SiO$_2$ interface. Here we show that a forming gas anneal is effective at removing shallow defects…

Materials Science · Physics 2017-03-23 Jin-Sung Kim , Alexei M. Tyryshkin , Stephen A. Lyon

In $e$-beam evaporated amorphous silicon ($a$-Si), the densities of two-level systems (TLS), $n_{0}$ and $\overline{P}$, determined from specific heat $C$ and internal friction $Q^{-1}$ measurements, respectively, have been shown to vary by…

Disordered Systems and Neural Networks · Physics 2020-11-17 D. R. Queen , X. Liu , J. Karel , H. C. Jacks , T. H. Metcalf , F. Hellman

The results of XPS core-level and valence band measurements, photoluminescence spectra of a-SiO2 implanted by Zn-ions (E=30 keV, D=1*1017 cm^-2) and Density Functional Theory calculations of electronic structure as well as formation…

A study is presented of the structural changes occurring as a function of the annealing conditions in hydrogenated amorphous Si/Ge multilayers prepared by sputtering. Annealing changes the structure of the as-deposited multilayer except for…

Materials Science · Physics 2009-02-12 C. Frigeri , M. Serenyi , A. Csik , Z. Erdelyi , D. L. Beke , L. Nasi

Two-dimensional (2D) silicon carbide is an emergent direct band-gap semiconductor, recently synthesized, with potential applications in electronic devices and optoelectronics. Here, we study nuclear quantum effects in this 2D material by…

Materials Science · Physics 2022-10-03 Carlos P. Herrero , Rafael Ramirez

We have studied the effect of thermal annealing on electron dephasing times $\tau_\phi$ in three-dimensional polycrystalline metals. Measurements are performed on as-sputtered and annealed AuPd and Sb thick films, using weak-localization…

Mesoscale and Nanoscale Physics · Physics 2009-05-05 J. J. Lin , Y. L. Zhong , T. J. Li

The focused helium ion beam microscope is a versatile imaging and nanofabrication instrument enabling direct-write lithography with sub-10-nm resolution. Subsurface damage and swelling of substrates due to helium ion implantation is…

Applied Physics · Physics 2024-10-08 Sherry Mo , Dana O. Byrne , Frances I. Allen