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The intricate fine structure of Kikuchi diffraction plays a vital role in probing phase transformations and strain distributions in functional materials, particularly in electron microscopy. Beyond these applications, it also proves…
Materials characterization using electron backscatter diffraction (EBSD) requires indexing the orientation of the measured region from Kikuchi patterns. The quality of Kikuchi patterns can degrade due to pattern overlaps arising from two or…
The thesis 'Investigations to Improve Energy Resolution for Neutron Backscattering Spectrometers Using Ideal Crystals with Low Dynamic Width of the Reflection Curve' first introduces the concept of the neutron backscattering spectrometer…
A tagged medium-energy neutron beam has been used in a precise measurement of the absolute differential cross section for np back-scattering. The results resolve significant discrepancies within the np database concerning the angular…
We address the identification of grain-corresponding Laue reflections in energy dispersive Laue diffraction (EDLD) experiments by formulating it as a clustering problem solvable through unsupervised machine learning (ML). To achieve…
We present a method for the precise determination of the full elasticity tensor from a single crystal diffraction experiment using monochromatic X-rays. For the two benchmark systems calcite and magnesium oxide we show that the measurement…
Strain engineering is used to obtain desirable materials properties in a range of modern technologies. Direct nanoscale measurement of the three-dimensional strain tensor field within these materials has however been limited by a lack of…
A Python program for calculating the metrics necessary to perform information-theory based symmetry classifications and quantifications of transmission electron diffraction spot patterns is introduced. It is the first of its kind, in that…
We experimentally and numerically examine stress-dependent electrical transport in granular materials to elucidate the origins of their universal dielectric response. The ac responses of granular systems under varied compressive loadings…
The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…
Deformation heterogeneities within microstructures of polycrystalline shape memory alloys (SMAs) during superelastic stressing are studied using both experiments and simulations. In situ X-ray diffraction, specifically the far-field high…
We present a methodology for designing metagratings for perfect anomalous refraction, based on multilayered loaded wire arrays. In recent work, it has been shown that such structures can implement perfect anomalous deflection and beam…
Understanding the local fracture resistance of microstructural features. such as brittle inclusions, coatings, and interfaces at the microscale under complex loading conditions is critical for microstructure-informed design of materials. In…
We present an analytical scheme for the design of realistic metagratings for wide-angle engineered reflection. These recently proposed planar structures can reflect an incident plane wave into a prescribed (generally non-specular) angle…
Scanning electron microscopy combined with electron backscatter diffraction (EBSD) and electron channeling provides rich crystallographic contrast, but the mutual influence of channeling-in and channeling-out is often simplified or…
In this study we elaborate on the recent concept of metagratings proposed in Ra'di et al. [Phys. Rev. Lett. 119, 067404 (2017)] for efficient manipulation of reflected waves. Basically, a metagrating is a set of 1D arrays of polarization…
The propagation of high-energy electrons in crystals is in general a complicated multiple scattering problem. However, along high-symmetry zone axes the problem can be mapped to the time evolution of a two-dimensional (2D) molecular system.…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
The industrialization of Laser Additive Manufacturing (LAM) is challenged by the undesirable microstructures and high residual stresses originating from the fast and complex solidification process. Non-destructive assessment of the…
We present a method to determine the strain tensor and local lattice rotation with Dark Field X-ray Microscopy. Using a set of at least 3 non-coplanar, symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept…