Related papers: Automated image acquisition for low-dose STEM at a…
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR)…
Capturing biological specimens at large scales with sub-micron resolution is crucial for biomedical research, but conventional cameras often can't handle the pixel requirements. While most microscopes use motorized stages to move samples…
Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…
We present an improved scheme for absorption imaging of alkali atoms at moderate magnetic fields, where the excited state is well in the Paschen-Back regime but the ground state hyperfine manifold is not. It utilizes four atomic levels to…
In this paper we present an autonomous system for acquiring close-range high-resolution images that maximize the quality of a later-on 3D reconstruction with respect to coverage, ground resolution and 3D uncertainty. In contrast to previous…
This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…
A recently identified class of receivers which demultiplex an optical field into a set of orthogonal spatial modes prior to detection can surpass canonical diffraction limits on spatial resolution for simple incoherent imaging tasks.…
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the…
The existing techniques for measuring high-dimensional pure states of light in the orbital angular momentum (OAM) basis either involve a large number of single-pixel data acquisitions and substantial postselection errors that increase with…
We present a comprehensive strategy and its practical implementation using the commercial ScanImage software platform to perform hyperspectral point scanning microscopy when a fast time dependent signal varies at each pixel level. In the…
Hyperspectral optoacoustic microscopy (OAM) enables obtaining images with label-free biomolecular contrast, offering excellent perspectives as a diagnostic tool to assess freshly excised and unprocessed tissues. However, time-consuming…
Partial-transfer absorption imaging is a tool that enables optimal imaging of atomic clouds for a wide range of optical depths. In contrast to standard absorption imaging, the technique can be minimally-destructive and can be used to obtain…
Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…
Absorption microscopy is a powerful technique, enabling the detection of single non- fluorescent molecules at room temperature. So far, the molecular absorption has been probed optically via the attenuation of a probing laser. The…
Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can…
We present a non-destructive beam profile imaging concept that utilizes machine learning tools, namely genetic algorithm with a gradient descent-like minimization. Electromagnetic fields around a charged beam carry information about its…
Field ion microscopy (FIM) allows to image individual surface atoms by exploiting the effect of an intense electric field. Widespread use of atomic resolution imaging by FIM has been hampered by a lack of efficient image processing/data…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…