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Related papers: Holographic Traction Force Microscopy

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We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…

Materials Science · Physics 2007-05-23 S. Banerjee , N. Gayathri , S. R. Shannigrahi , S. Dash , A. K. Tyagi , B. Raj

A rigorous methodology is developed for computing elastic fields generated by experimentally observed defect structures within grains in a polycrystal that has undergone tensile extension. An example application is made using a near-field…

Materials Science · Physics 2023-10-10 Siddharth Singh , He Liu , Rajat Arora , Robert M. Suter , Amit Acharya

Heat transport in low-dimensional solids can significantly differ from their bulk counterpart due to various size-related effects. This offers rich heat transport phenomena to emerge. However, finding an appropriate thermometry method for…

Mesoscale and Nanoscale Physics · Physics 2025-06-12 T. Serkan Kasırga , Berke Köker

Stacking order in bilayers of transition metal dichalcogenides (TMDs) controls structural symmetry and layer-to-layer interactions, offering a direct route to tune their electronic properties and enable optoelectronic applications. The work…

Mesoscale and Nanoscale Physics · Physics 2026-04-14 Anagha Gopinath , Faiha Mujeeb , Subhabrata Dhar , Jyoti Mohanty

Strong coupling between electrical and mechanical phenomena and the presence of switchable polarization have enabled applications of ferroelectric materials for nonvolatile memories (FeRAM), data storage, and ferroelectric lithography.…

Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…

Instrumentation and Detectors · Physics 2007-05-23 Robert W. Stark

Cellular traction forces are conventionally measured by tracking the displacement of beads or micropillars, an approach fundamentally limited by optical diffraction and the classical Euler-Bernoulli beam assumption, which is accurate only…

Optics · Physics 2026-03-09 Linjie Ma , Bicong Wang , Tai Nam Yip , Yong Hou , Yuan Lin , Zhiqin Chu

Deformation gradient tensor fields are reconstructed in three dimensions (mapping all 9 tensor components) using synthetic Dark-Field X-ray Microscopy data. Owing to the unique properties of the microscope, our results imply that the…

Materials Science · Physics 2025-09-09 Axel Henningsson , Sina Borgi , Grethe Winther , Anter El-Azab , Henning Friis Poulsen

Force spectroscopy using magnetic tweezers (MT) is a powerful method to probe the physical characteristics of single polymers. Typically, molecules are functionalized for specific attachment to a glass surface at one end and a micron-scale…

Biological Physics · Physics 2021-10-20 Joseph G. Piccolo , Joshua Mendez Harper , Dan Kovari , David Dunlap , Laura Finzi

Protein rotational kinetics are essential for understanding macromolecular behavior in crowded environments, yet measuring these dynamics at solid-liquid interfaces remains a significant challenge due to low signal strengths. Here, we…

Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales[1, 2]. The microscopic origin of friction is poorly understood, due in part to a lack of methods for measuring the force on a…

Mesoscale and Nanoscale Physics · Physics 2017-01-04 Per-Anders Thorén , Astrid S. de Wijn , Riccardo Borgani , Daniel Forchheimer , David B. Haviland

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

Materials Science · Physics 2007-05-23 Franz-Josef Elmer

We demonstrate an atomic force microscopy based method for estimation of defect density by identification of threading dislocations on a non-flat surface resulting from metamorphic growth. The discussed technique can be applied as an…

Materials Science · Physics 2015-06-08 Agnieszka Gocalinska , Marina Manganaro , Valeria Dimastrodonato , Emanuele Pelucchi

The first order reversal curve (FORC) method is a macroscopic measurement technique which can be used to extract quantitative, microscopic properties of hysteretic systems. Using magnetic transmission X-ray microscopy (MTXM), local…

Materials Science · Physics 2024-06-12 Dustin A. Gilbert , Mi-Young Im , Kai Liu , Peter Fischer

Optical and electrical properties of two-dimensional transition metal dichalcogenides (TMDCs) grown by chemical vapor deposition (CVD) are strongly determined by their microstructure. Consequently, the visualization of spatial structural…

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

Piezoresponse force microscopy (PFM) is a powerful characterization technique to readily image and manipulate ferroelectrics domains. PFM gives insight into the strength of local piezoelectric coupling as well as polarization direction…

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

Materials Science · Physics 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

Intercalation of two dimensional materials, particularly transition metal dichalcogenides, is a noninvasive way to modify electronic, optical and structural properties of these materials. However, research of these atomic-scale phenomena…

Ferromagnetic Resonance Force Microscopy (FMRFM) offers a means of performing local ferromagnetic resonance. We have studied the evolution of the FMRFM force spectra in a continuous 50 nm thick permalloy film as a function of probe-film…