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In this paper we compare two different diagnostics for estimating stellar masses in early-type galaxies and we establish their level of reliability. In particular, we consider the well-studied sample of 15 field elliptical galaxies selected…
A widely used method to measure the bending rigidity of bilayer membranes is fluctuation spectroscopy, which analyses the thermally-driven membrane undulations of giant unilamellar vesicles recorded with either phase-contrast or confocal…
Photothermal spectroscopy and microscopy provides a route to measure the spectral and spatial properties of individual nanoscopic absorbers, independent from scattering, extinction, and emission. The approach relies upon use of two light…
The Spectral Energy Distribution (SED) mode of the Multiband Imaging Photometer for Spitzer (MIPS) Space Telescope provides low-spectral resolution (R ~ 15-25) spectroscopy in the far infrared using the MIPS 70 um detector. A reflective…
Transition metal dichalcogenides (TMDs) attract significant attention due to their exceptional optical and excitonic properties. It was understood already in the 1960s, and recently rediscovered, that many TMDs possess high refractive index…
We have measured the optical constants of GaMnAs from 0.62 eV to 6 eV, using spectroscopic ellipsometry. The second derivatives of the dielectric function are examined through a critical point analysis. The E1 critical point shifts to…
Optical constants of non-stoichiometric amorphous magnesium-iron silicates are determined. It is demonstrated that these can well reproduce the observed mid-infrared emission spectra of evolved stars. Stoichiometric and non-stoichiometric…
This paper describes an experimental setup that has been developed to measure and characterise properties of Silicon Photomultipliers (SiPM). The measured SiPM properties are of general interest for a multitude of potential applications and…
We present the use of a commercially available fixed-angle multi-wavelength ellipsometer for quickly measuring the thickness of NbN thin films for the fabrication and performance improvement of superconducting nanowire single photon…
Taking advantage of the exceptional capabilities of ACS on board of HST, we derive Surface Brightness Fluctuation (SBF) measurements in the B and I bands from images of six elliptical galaxies with $1500 \leq cz \leq 3500$. Given the low…
Magneto-Optical Traps have been used for several decades. Among fundamental mechanisms occuring in such traps, the magnitude of the multiple scattering is still unclear. Indeed, many experimental situations cannot be modeled easily,…
Schlieren deflectometry aims at characterizing the deflections undergone by refracted incident light rays at any surface point of a transparent object. For smooth surfaces, each surface location is actually associated with a sparse…
The flicker-noise spectroscopy (FNS) approach is used to determine the dynamic characteristics of neuromagnetic responses by analyzing the magnetoencephalographic (MEG) signals recorded as the response of a group of control human subjects…
We report on the use of time-resolved optical ellipsometry to monitor the deposition of single atomic layers with subatomic sensitivity. Ruddlesden-Popper thin films of SrO(SrTiO3)n=4 were grown by means of metalorganic aerosol deposition…
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in their study. Commonly used atomic force microscopy and Raman…
In this study, we investigated the application of the direct sampling method (DSM) to identify small dielectric objects in a limited-aperture inverse scattering problem. Unlike previous studies, we consider the bistatic measurement…
Accurate and fast 3D imaging of specular surfaces still poses major challenges for state-of-the-art optical measurement principles. Frequently used methods, such as phase-measuring deflectometry (PMD) or shape-from-polarization (SfP), rely…
An automatic target monitoring method based on photographs taken by a CMOS photo-camera has been developed for the MEG II detector. The technique could be adapted for other fixed-target experiments requiring good knowledge of their target…
An optical microscope is described that reveals contrast in the Mueller matrix images of a thin, transparent or semi-transparent specimen located within an anisotropic object plane (anisotropic filter). The specimen changes the anisotropy…
Optical measurements of nanostructured GaSb prepared by sputtering is presented. The optical response is studied by Mueller Matrix Ellipsometry (MME) in the visible range (430--850nm), and by spectroscopic ellipsometry in the range…