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Aberration-corrected electron microscopy can resolve the smallest atomic bond-lengths in nature. However, the high-convergence angles that enable spectacular resolution in 2D have unknown 3D resolution limits for all but the smallest…
Recently introduced Surface Nanoscale Axial Photonics (SNAP) makes it possible to fabricate high Q-factor microresonators and other photonic microdevices by dramatically small deformation of the optical fiber surface. To become a practical…
This article evaluates the lens characteristics of a non-rotationally symmetric electron lens based on a ponderomotive potential (i.e., a ponderomotive lens) formed by intersecting one or more optical beams perpendicular to an electron…
Images obtained by drift-scanning with a stationary telescope are affected by the declination-dependent curvature of star trails. The image displacement to curvature and drift rate variation increases with the angular field of view and can…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
We propose the possibilities of designing nano-scale rectifiers using mesoscopic rings. A single mesoscopic ring is used for half-wave rectification, while full-wave rectification is achieved using two such rings and in both cases each ring…
With the advent of microsphere assisted microscopy in 2011, this technique emerged as a simple and easy way to obtain optical super-resolution. Although the possible mechanisms of imaging by microspheres are debated in the literature, most…
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being…
Lensfree on-chip microscopy is an emerging imaging technique that can be used to visualize and study biological specimens without the need for imaging lens systems. Important issues that can limit the performance of lensfree on-chip…
Optical aberrations prevent telescopes from reaching their theoretical diffraction limit. Once estimated, these aberrations can be compensated for using deformable mirrors in a closed loop. Focal plane wavefront sensing enables the…
Two-dimensional hexagonal boron nitride offers intriguing opportunities for advanced studies of light-matter interaction at the nanoscale, specifically for realizations in quantum nanophotonics. Here, we demonstrate the engineering of…
Moving towards significantly smaller nanostructures, direct structuring techniques such as electron beam lithography approach fundamental limitations in feature size and aspect ratios. Application of nanostructures like diffractive X-ray…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…
Electron tomographic reconstruction is a method for obtaining a three-dimensional image of a specimen with a series of two dimensional microscope images taken from different viewing angles. Filtered backprojection, one of the most popular…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
Single-pixel imaging, originally developed in light optics, facilitates fast three-dimensional sample reconstruction, as well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial…
Technological advancement has led to improvement in the design capabilities of astronomical spectrographs, allowing for high precision spectroscopy, thereby expanding the realms of observational astronomy. High-resolution spectrographs use…
The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…
The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…