Related papers: Spherical aberration correction in a scanning tran…
Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning…
Achieving atomic resolution in electron microscopy has historically been hindered by spherical aberration, a fundamental limitation of conventional electron lenses. Its correction typically requires complex assemblies of electromagnetic…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
Aberration correctors are essential elements for achieving atomic resolution in state-of-the-art electron microscopes. Conventional correctors are based on a series of multipolar electron lenses, but more versatile alternatives are…
We theoretically demonstrate that ponderomotive interactions near the electron cross-over can be used for aberration correction in ultrafast electron microscopes. Highly magnified electron shadow images from Si$_3$N$_4$ thin films are…
The interaction between free electrons and optical near fields is attracting increasing attention as a way to manipulate the electron wave function in space, time, and energy. Relying on currently attainable experimental capabilities, we…
Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning…
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…
The key to optimizing spatial resolution in a state-of-the-art scanning transmission electron microscope is the ability to precisely measure and correct for electron optical aberrations of the probe-forming lenses. Several diagnostic…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Diffraction-limited imaging in epi-fluorescence microscopy remains a challenge when sample aberrations are present or when the region of interest rests deep within an inhomogeneous medium. Adaptive optics is an attractive solution albeit…
We show that electron irradiation in a dedicated scanning transmission microscope can be used as a nano-electron-lithography technique allowing the controlled reshaping of single walled carbon and boron nitride nanotubes. The required…
We propose and theoretically demonstrate a technique that allows one to compensate for chromatic aberrations of traditional electron lenses in ultrafast electron microscopes. The technique is based on space- and time-dependent phase…
Current progress in programmable electrostatic phase plates raises questions about their usefulness for specific applications. Here, we explore different designs for such phase plates with the specific goal of correcting spherical…
High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt…
We developed a method to make GEM foils with a spherical geometry. Tests of this procedure and with the resulting spherical GEMs are presented. Together with a spherical drift electrode, a spherical conversion gap for x-rays can be formed.…
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to…
The aberrations induced by the sample and/or by the sample holder limit the resolution of optical microscopes. Wavefront correction can be achieved using a deformable mirror with wavefront sensorless optimization algorithms but, despite the…
We report the development of a chromatic and spherical aberration corrector based on combinations of hexapole and quadrupole fields. Thick hexapole fields are used to generate negative third order spherical aberration and to correct…
Aberrations limit scanning fluorescence microscopy when imaging in scattering materials such as biological tissue. Model-based approaches for adaptive optics take advantage of a computational model of the optical setup. Such models can be…