Electron Beam Aberration Correction Using Optical Near Fields
Abstract
The interaction between free electrons and optical near fields is attracting increasing attention as a way to manipulate the electron wave function in space, time, and energy. Relying on currently attainable experimental capabilities, we design optical near-field plates to imprint a lateral phase on the electron wave function that can largely correct spherical aberration without the involvement of electric or magnetic lenses in the electron optics, and further generate on-demand lateral focal spot profiles. Our work introduces a disruptive and powerful approach toward aberration correction based on light-electron interactions that could lead to compact and versatile time-resolved free-electron microscopy and spectroscopy.
Cite
@article{arxiv.2004.12014,
title = {Electron Beam Aberration Correction Using Optical Near Fields},
author = {Andrea Konečná and F. Javier García de Abajo},
journal= {arXiv preprint arXiv:2004.12014},
year = {2020}
}
Comments
8 pages, 6 figures, 53 references