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The mechanical properties of PC12 living cells have been studied at the nanoscale with a Force Feedback Microscope using two experimental approaches. Firstly, the local mechanical impedance of the cell membrane has been mapped…
An LCL filter offers superior attenuation for high-frequency harmonics for three-phase grid-following inverters compared to LC and L filters. However, it also introduces an inherent resonance peak, which can lead to power quality issues or…
This paper enumerates new architecture of low power dual-edge triggered Flip-Flop (DETFF) designed at 180nm CMOS technology. In DETFF same data throughput can be achieved with half of the clock frequency as compared to single edge triggered…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components…
Accessing, controlling and understanding nanoscale friction and dissipation is a crucial issue in nanotechnology, where moving elements are central. Recently, ultra-sensitive noncontact pendulum Atomic Force Microscope (AFM) succeeded in…
Charge and energy transfer in biological and synthetic organic materials are strongly influenced by the coupling of electronic states to high-frequency underdamped vibrations under dephasing noise. Non-perturbative simulations of these…
Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
Small-amplitude dynamic atomic force microscopy (dynamic-AFM) in a simple nonpolar liquid was studied through molecular dynamics simulations. We find that within linear dynamics regime, the contact stiffness and damping of the confined film…
Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…
This paper proposes a novel wide-area control strategy for modulating the active power injections to damp the critical frequency oscillations in power systems, this includes the inter-area oscillations and the transient frequency swing. The…
Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The oscillating AFM tip modulates the…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
In high-dynamic range (HDR) analog-to-digital converters (ADCs), having many quantization bits minimizes quantization errors but results in high bit rates, limiting their application scope. A strategy combining modulo-folding with a low-DR…
We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…
Distributed point charge models (DCM) and their minimal variants (MDCM) have been integrated with tools widely used for condensed-phase simulations, including a virial-based barostat and a slow-growth algorithm for thermodynamic…
Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…
Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…