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Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

This work proposes an innovative approach to improve Bragg coherent diffraction imaging (BCDI) microscopy applied to time evolving crystals and/or non-homogeneous crystalline strain fields, identified as two major limitations of BCDI…

Optics · Physics 2024-03-12 I. Calvo-Almazán , V. Chamard , T. Grünewald , M. Allain

Electron tomography is becoming an increasingly important tool in materials science for studying the three-dimensional morphologies and chemical compositions of nanostructures. The image quality obtained by many current algorithms is…

Probabilistic denoising diffusion models (DDMs) have set a new standard for 2D image generation. Extending DDMs for 3D content creation is an active field of research. Here, we propose TetraDiffusion, a diffusion model that operates on a…

Computer Vision and Pattern Recognition · Computer Science 2024-08-12 Nikolai Kalischek , Torben Peters , Jan D. Wegner , Konrad Schindler

The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…

Materials Science · Physics 2019-04-12 AJ Wilkinson , PB Hirsch

Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of…

Mesoscale and Nanoscale Physics · Physics 2015-03-18 J. Y. Mutus , L. Livadaru , J. T. Robinson , R. Urban , M. H. Salomons , M. Cloutier , P. E. Sheehan , R. A. Wolkow

Three-dimensional charge density maps computed by first-principles methods provide information about atom positions and the bonds between them, data which is particularly valuable when trying to understand the properties of point defects,…

Materials Science · Physics 2008-10-22 Christoph T. Koch

Interfacial reconstruction between two-dimensional (2D) materials and metal substrates fundamentally governs heterostructure properties, yet conventional flat substrates fail to capture the continuous crystallographic landscape. Here, we…

Mesoscale and Nanoscale Physics · Physics 2026-01-01 Li-Qun Shen , Hao-Jin Wang , Mengzhao Sun , Yang Xiang , Xin-Ning Tian , Yue Chai , Yue Yang , Feng Ding , Xiao Kong , Marc-Georg Willinger , Zhu-Jun Wang

Three-dimensional X-ray diffraction (3DXRD) is shown to be feasible at the I12 Joint Engineering, Environmental and Processing (JEEP) beamline of Diamond Light Source. As a demonstration, a microstructually simple low-carbon ferritic steel…

We demonstrate assembly of di-, tri- and tetrameric Si clusters on the graphene surface using sub-atomically focused electron beam of a scanning transmission electron microscope. Here, an electron beam is used to introduce Si substitutional…

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying…

Soft Condensed Matter · Physics 2009-11-13 Nathan S. Greeney , John A. Scales

A dielectric multilayer platform has been investigated as a foundation for two-dimensional optics. In this paper, we present, to the best of our knowledge, the first experimental demonstration of absorption of Bloch surface waves in the…

We theorize the surface step characterization by reflected incoherent-light differential interference microscopy with consideration of the optical diffraction effect. With the integration of localization analysis, we develop a quantitative…

Optics · Physics 2022-11-30 Ka Hung Chan , Shengwang Du , Xian Chen

Limited-angle electron tomography aims to reconstruct 3D shapes from 2D projections of Transmission Electron Microscopy (TEM) within a restricted range and number of tilting angles, but it suffers from the missing-wedge problem that causes…

Computer Vision and Pattern Recognition · Computer Science 2026-05-05 Zhantao Deng , Mériem Er-Rafik , Anna Sushko , Cécile Hébert , Pascal Fua

This paper presents a CAD-based approach for automated surface defect detection. We leverage the a-priori knowledge embedded in a CAD model and integrate it with point cloud data acquired from commercially available stereo and depth…

Computer Vision and Pattern Recognition · Computer Science 2025-01-31 Matteo Dalle Vedove , Matteo Bonetto , Edoardo Lamon , Luigi Palopoli , Matteo Saveriano , Daniele Fontanelli

The structure of a physisorbed sub-monolayer of 1,2-bis(4-pyridyl)ethylene (bpe) on epitaxial graphene is investigated by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy. Additionally, non-equilibrium heat-transfer between…

Materials Science · Physics 2020-08-26 Bareld Wit , Ole Bunjes , Martin Wenderoth , Claus Ropers

We propose a parametric finite element method (PFEM) for efficiently solving the morphological evolution of solid-state dewetting of thin films on a flat rigid substrate in three dimensions (3D). The interface evolution of the dewetting…

Computational Physics · Physics 2020-03-03 Quan Zhao , Wei Jiang , Weizhu Bao

Depth information provides valuable insights into the 3D structure especially the outline of objects, which can be utilized to improve the semantic segmentation tasks. However, a naive fusion of depth information can disrupt feature and…

Computer Vision and Pattern Recognition · Computer Science 2024-08-20 Wei Sun , Yuan Li , Qixiang Ye , Jianbin Jiao , Yanzhao Zhou

Three-dimensional mapping of surface structures is important in a wide range of biological, technological, healthcare and research applications, including taxonomy, microfluidics and fabrication. Neutral helium atom beams have been…

We characterize nano-textured surfaces by optical diffraction techniques using an adapted commercial light microscope with two detectors, a CCD camera and a spectrometer. The acquisition and analyzing time for the topological parameters…

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