Related papers: High-Throughput Atomic Force Microscopes Operating…
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…
Advanced integration technologies greatly enhance the prospects and reliability of practical quantum sensors, atomic clocks, and quantum information technologies. The performance and proliferation of these devices at chip-scale is…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
We focus on the potential possibilities for supporting Scanning Probe Microscopy measurements, emphasizing the application of Artificial Intelligence, especially Machine Learning as well as quantum computing. It turned out that Artificial…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
Plastic nanoparticles present technological opportunities and environmental concerns, but measurement challenges impede product development and hazard assessment. To meet these challenges, we advance a lateral nanoflow assay that integrates…
Recent advances in the technology of transmission electron microscopy have allowed for a more precise visualization of materials and physical processes, such as metal oxidation. Nevertheless, the quality of information is limited by the…
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod…
Ultra-low field (ULF) MRI is a promising method for inexpensive medical imaging with various additional advantages over conventional instruments such as low weight, low power, portability, absence of artifacts from metals, and high…
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…
AFM-based technique of nanolithography is proposed. The method enables rapid point by point indentation with a sharp tip. When used in tandem with single-crystal diamond tips, this technique allows the creation of high aspect ratio grooves…
Thiol self assembled monolayers (SAMs) are widely used in many nano- and bio-technology applications. We report a new approach to create and characterize a thiol SAMs micropattern with alternating charges on a flat goldcoated substrate…
We investigate the modification of photoluminescence (PL) from single semiconductor nanocrystal quantum dots (NCs) in proximity of metal and semiconducting Atomic Force Microscope (AFM) tips. The presence of the tip alters the radiative…
Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…
Reducing the scanning time of very-low field (VLF) magnetic resonance imaging (MRI) scanners, commonly employed for stroke diagnosis, can enhance patient comfort and operational efficiency. The conventional parallel imaging (PI) technique…
The Photonic Force Microscope (PFM) is an opto-mechanical technique based on an optical trap that can be assumed to probe forces in microscopic systems. This technique has been used to measure forces in the range of pico- and femto-Newton,…
Sensing a magnetic field with an atomic magnetometer operated in real time presents significant challenges, primarily due to sensor non-linearity, the presence of noise, and the need for one-shot estimation. To address these challenges, we…
Laser enhanced field evaporation of surface atoms in Laser-assisted Atom Probe Tomography (La-APT) can simultaneously excite phtotoluminescence in semiconductor or insulating specimens. An atom probe equipped with appropriate focalization…
This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…