A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy
Abstract
Laser enhanced field evaporation of surface atoms in Laser-assisted Atom Probe Tomography (La-APT) can simultaneously excite phtotoluminescence in semiconductor or insulating specimens. An atom probe equipped with appropriate focalization and collection optics has been coupled with an in-situ micro-Photoluminescence ({\mu}PL) bench that can be operated during APT analysis. The Photonic Atom Probe instrument we have developped operates at frequencies up to 500 kHz and is controlled by 150 fs laser pulses tunable in energy in a large spectral range (spanning from deep UV to near IR). Micro-PL spectroscopy is performed using a 320 mm focal length spectrometer equipped with a CCD camera for time-integrated and with a streak camera for time-resolved acquisitions. An exemple of application of this instrument on a multi-quantum well oxide heterostructure sample illustrates the potential of this new generation of tomographic atom probe.
Keywords
Cite
@article{arxiv.2007.11907,
title = {A Photonic Atom Probe coupling 3D Atomic Scale Analysis with in situ Photoluminescence Spectroscopy},
author = {Jonathan Houard and Antoine Normand and Enrico Di Russo and Christian Bacchi and Pradip Dalapati and Georges Beainy and Simona Moldovan and Gerald Da Costa and Fabien Delaroche and Charly Vaudolon and Jean Michel Chauveau and Maxime Hugues and Didier Blavette and Bernard Deconihout and Angela Vella and François Vurpillot and Lorenzo Rigutti},
journal= {arXiv preprint arXiv:2007.11907},
year = {2020}
}
Comments
22 pages, 4 figures. The following article has been accepted by the Review of Scientific Instruments. After it is published, it will be found at https://publishing.aip.org/resources/librarians/products/journals/