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Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan…
Because scanning-LIDAR sensors require finite time to create a point cloud, sensor motion during a scan warps the resulting image, a phenomenon known as motion distortion or rolling shutter. Motion-distortion correction methods exist, but…
Reliable quantitative analysis in scanning (transmission) electron microscopy (S(T)EM) is often hindered by image drift during long-duration spectral mapping for elemental analysis or for various material functions. We here present…
Digital images from crystals, as projected from the third spatial dimension and recorded in atomic resolution with any kind of real-world microscope, feature necessarily broken symmetries of the translation-periodicity-restricted Euclidean…
Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…
A sparse modeling approach is proposed for analyzing scanning tunneling microscopy topography data, which contains numerous peaks corresponding to surface atoms. The method, based on the relevance vector machine with $\mathrm{L}_1$…
In this paper we present a simple and robust method for self-correction of camera distortion using single images of scenes which contain straight lines. Since the most common distortion can be modelled as radial distortion, we illustrate…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…
Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe microscopy, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by…
Image distortion correction is a critical pre-processing step for a variety of computer vision and image processing algorithms. Standard real-time software implementations are generally not suited for direct hardware porting, so…
Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic displacements and charge density modulations, at an Angstrom…
Images obtained by drift-scanning with a stationary telescope are affected by the declination-dependent curvature of star trails. The image displacement to curvature and drift rate variation increases with the angular field of view and can…
We have developed a method for the linear reconstruction of an image from undersampled, dithered data, which has been used to create the distributed, combined Hubble Deep Field images -- the deepest optical images yet taken of the universe.…
In the conventional change detection (CD) pipeline, two manually registered and labeled remote sensing datasets serve as the input of the model for training and prediction. However, in realistic scenarios, data from different periods or…
Charge Transfer Inefficiency (CTI) due to radiation damage above the Earth's atmosphere creates spurious trailing in Hubble Space Telescope (HST) images. Radiation damage also creates unrelated warm pixels - but these happen to be perfect…
Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…