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The dislocation microstructure developing during plastic deformation strongly influences the stress-strain properties of crystalline materials. The novel method of high resolution electron backscatter diffraction (HR-EBSD) offers a new…

Correlations between dislocations in crystals reduce the elastic energy via screening of the strain by the surrounding dislocations. We study the correlations of threading dislocations in GaN epitaxial films with dislocation densities of…

Materials Science · Physics 2025-12-11 Vladimir M. Kaganer , Domenik Spallek , Philipp John , Oliver Brandt , Jonas Lähnemann

Mechanical testing of micropillars is a field that involves new physics, as the behaviour of materials is non-deterministic at this scale. To better understand their deformation mechanisms we applied 3-dimensional high angular resolution…

We examine the effect of pattern quality on the output of high-angular resolution electron backscatter diffraction (HR-EBSD) analyses. Band contrast, as a proxy for pattern quality, was varied by adjusting the number of frames averaged per…

Materials Science · Physics 2025-07-31 Harison S. Wiesman , David Wallis

For high (angular) resolution electron backscatter diffraction (HR-EBSD), the selection of a reference diffraction pattern (EBSP0) significantly affects the precision of the calculated strain and rotation maps. This effect was demonstrated…

Materials Science · Physics 2023-02-21 Abdalrhaman Koko , Vivian Tong , Angus J. Wilkinson , T. James Marrow

Analysis of distortions of the crystal lattice within individual mineral grains is central to the investigation of microscale processes that control and record tectonic events. These distortions are generally combinations of lattice…

Materials Science · Physics 2019-06-04 David Wallis , Lars N. Hansen , T. Ben Britton , Angus J. Wilkinson

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative…

Instrumentation and Detectors · Physics 2017-10-03 T Ben Britton , James L R Hickey

Understanding the local fracture resistance of microstructural features. such as brittle inclusions, coatings, and interfaces at the microscale under complex loading conditions is critical for microstructure-informed design of materials. In…

We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation gradient tensors from experimentally measured Kikuchi…

High-Resolution Electron Backscatter Diffraction (HR-EBSD) has advanced rapidly in recent years, significantly improving elastic strain measurements and dislocation density evaluation with submicron spatial resolution. To achieve better…

Materials Science · Physics 2026-04-20 Xinke Xiao , Tianle Ma , Lingxuan Shao , Jun Liu , Qiwei Shi , Canying Cai , Stéphane Roux

The design of novel materials hinges on the understanding of structure-property relationships. However, in recent times, our capability to synthesize a large number of materials has outpaced our speed at characterizing them. While the…

Within the continuum dislocation theory the asymptotic analysis of the plane strain crack problem for a single crystal having only one active slip system on each half-plane is provided. The results of this asymptotic analysis show that the…

Materials Science · Physics 2015-08-17 Khanh Chau Le , Van Nha Tran

A theory of flow stress, including the yield strength is proposed for the class of PC materials with equilibrium defect structure (EDS), which is established in the PC material after series of $N_0$ similar treatments of severe plastic…

Materials Science · Physics 2021-03-09 Alexander A. Reshetnyak

In this study, we use discrete dislocation dynamics (DDD) simulation to investigate the effect of heterogeneous dislocation density on the transition between quasi-elastic deformation and plastic flow in face-centered cubic single crystals.…

Materials Science · Physics 2019-07-24 Xu Zhang , Jian Xiong , Haidong Fan , Michael Zaiser

Electron Backscatter Diffraction (EBSD) is a technique to obtain microcrystallographic information from materials by collecting large-angle Kikuchi patterns in the scanning electron microscope (SEM). An important fundamental question…

Materials Science · Physics 2019-03-06 Aimo Winkelmann , T. Ben Britton , Gert Nolze

Understanding the evolution of dislocation structures during plastic deformation is critical for predicting the mechanical performance of metallic materials. In this work, we applied in situ scanning electron microscopy/electron backscatter…

Materials Science · Physics 2026-03-24 Mikhail Lebyodkin , Maxim Gussev , Jamieson Brechtl , Tatiana Lebedkina

Diffraction-based stress analysis of textured materials depends on understanding their elastic heterogeneity and its influence on microscopic strain distributions, which is generally done by using simplifying assumptions for crystallite…

Materials Science · Physics 2025-05-23 Maximilian Krause , Nicola Simon , Claudius Klein , Jens Gibmeier , Thomas Böhlke

Metals are important structural materials for transport and the built environment. Low carbon steels can fail through strain localisation due to the role of interstitial solute atoms (such as carbon and nitrogen) interacting with mobile…

Materials Science · Physics 2019-01-24 James L R Hickey , S Rouland , T B Britton

Dislocations are fundamental crystal defects whose stress fields govern a wide range of material properties. The analytical form of the stress tensor around single dislocation was established by elasticity theory more than 80 years ago and…

Materials Science · Physics 2026-01-05 Takeyuki Tsuji , Shunta Harada , Tokuyuki Teraji

We describe a lattice-based crystallographic approximation for the analysis of distorted crystal structures via Electron Backscatter Diffraction (EBSD) in the scanning electron microscope. EBSD patterns are closely linked to local lattice…

Materials Science · Physics 2019-01-02 Aimo Winkelmann , Gert Nolze , Grzegorz Cios , Tomasz Tokarski
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