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Electron beam induced current (EBIC) is a powerful technique which measures the charge collection efficiency of photovoltaics with sub-micron spatial resolution. The exciting electron beam results in a high generation rate density of…

Materials Science · Physics 2014-10-17 Paul M. Haney , Heayoung P. Yoon , Prakash Koirala , Robert W. Collins , Nikolai B. Zhitenev

The purpose of this project is to investigate the use of charge couple devices (CCDs) to detect electrons directly. This can be done in transmission electron microscopy (TEM) for electrons over 100 KeV, but for space plasma instruments,…

Instrumentation and Detectors · Physics 2015-10-28 S. R. Mirfayzi

Focused MeV ion beams with micrometric resolution are suitable tools for the direct writing of conductive graphitic channels buried in an insulating diamond bulk. Their effectiveness has been shown for the fabrication of multi-electrode…

This paper describes both an experimental methodology based on the Ion Beam Induced Charge (IBIC) technique and the relevant interpretative model, which were adopted to characterize the electronic features of power diodes. IBIC spectra were…

Instrumentation and Detectors · Physics 2021-02-03 M. Pezzarossa , E. Cepparrone , D. Cosic , M. Jakšić , G. Provatas , M. Vićentijević , E. Vittone

The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge collection microscopies stems in the use of MeV ion probes,…

We explored the efficacy of lab-grown diamonds as potential target materials for the direct detection of sub-GeV dark matter~(DM) using metallic magnetic calorimeters~(MMCs). Diamond, with its excellent phononic properties and the low…

Instrumentation and Detectors · Physics 2025-03-26 I. Kim , N. A. Kurinsky , H. Kagan , S. T. P. Boyd , G. B. Kim

A new type of resistive plate chamber with thin-film electrodes based on diamond-like carbon is under development for background identification in the MEG II experiment. Installed in a low-momentum and high-intensity muon beam, the detector…

Instrumentation and Detectors · Physics 2023-07-19 Kensuke Yamamoto , Sei Ban , Kei Ieki , Atsuhiko Ochi , Rina Onda , Wataru Ootani , Atsushi Oya , Masato Takahashi

The beam condition monitoring leakage (BCML) system is a beam monitoring device in the compact muon solenoid (CMS) experiment at the large hadron collider (LHC). As detectors 32 poly-crystalline (pCVD) diamond sensors are positioned in…

Instrumentation and Detectors · Physics 2016-09-27 Florian Kassel , Moritz Guthoff , Anne Dabrowski , Wim de Boer

Electron beam ion traps (EBIT) are ideal tools for both production and study of highly charged ions (HCI). In order to reduce their construction, maintenance, and operation costs we have developed a novel, compact, room-temperature design,…

The charge collection properties of CVD diamond have been investigated with ionising radiation. In this study two CVD diamond samples, prepared with electrical contacts have been used as solid state ionisation chambers. The diamonds have…

High Energy Physics - Experiment · Physics 2015-06-25 Ties Behnke , Petra Hüntemeyer , Alexander Oh , Johannes Steuerer , Albrecht Wagner , Wolfram Zeuner

Emerging 3D chips stacking and MEMS/Sensors packaging technologies are using DRIE (Deep Reactive Ion Etching) to etch through-silicon via (TSV) for advanced interconnections. The interconnection step can be done prior to or post CMOS…

Other Computer Science · Computer Science 2008-12-18 M. Puech , Jean-Marc Thevenoud , J. M. Gruffat , N. Launay , N. Arnal , P. Godinat

Silicon carbide detectors exhibit good detection performance and are being considered for detection applications. However, the presence of surface electrode of detector limits the application of low-penetration particle detectors,…

Instrumentation and Detectors · Physics 2025-05-29 Zhenyu Jiang , Xuemei Lu , Congcong Wang , Yingjie Huang , Xiaoshen Kang , Suyu Xiao , Xiyuan Zhang , Xin Shi

3D silicon detectors are characterized by cylindrical electrodes perpendicular to the surface and penetrating into the bulk material in contrast to standard Si detectors with planar electrodes on its top and bottom. This geometry renders…

During the scheduled high luminosity upgrade of LHC, the world's largest particle physics accelerator at CERN, the position sensitive silicon detectors installed in the vertex and tracking part of the CMS experiment will face more intense…

Instrumentation and Detectors · Physics 2015-01-21 T. Peltola

Focused MeV ion microbeams are suitable tools for the direct writing of conductive graphitic channels buried in an insulating diamond bulk, as demonstrated in previous works with the fabrication of multi-electrode ionizing radiation…

We report on a novel method for the fabrication of three-dimensional buried graphitic micropaths in single crystal diamond with the employment of focused MeV ions. The use of implantation masks with graded thickness at the sub-micrometer…

The continuous scaling of semiconductor-based technologies to micron and sub-micron regimes has resulted in higher device density and lower power dissipation. Many physical phenomena such as self-heating or current leakage become…

We have been developing X-ray SOIPIXs for next-generation satellites for X-ray astronomy. Their high time resolution ($\sim10~\mu$s) and event-trigger-output function enable us to read out without pile-ups and to use anti-coincidence…

The present investigation reports on the fabrication and characterization of heterojunctions based on in situ Eu doped CdO layers, which were deposited on p-type silicon using the plasma assisted molecular beam epitaxy (PA MBE) method. The…

Background: Commercially available ionization chambers (ICs) exposed to ultra-high dose per pulse (UHDP) exhibit deviations from a linear dose response due to volume recombination. Simulation models have been developed to describe the…