Related papers: Demonstration of single-shot picosecond time-resol…
The use of highly sensitive pixelated direct detectors has dramatically improved the performance of high energy instrumentation such as transmission electron microscopy. Here, we describe a recently developed monolithic active pixel sensor…
Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image…
We present two compact ultrafast electron injector designs with integrated focusing that provide high peak brightness of up to $1.9*10^{12} A/m^2Sr^2$ with 10s of electrons per laser pulse using silicon carbide electrodes and silicon…
Capturing ultrafast transient phenomena conventionally requires streak cameras or computational imaging based on compressed sensing, which lead to complex and costly systems. In this Letter, we demonstrate, to the best of our knowledge, the…
We demonstrate that light resonant with the bandgap forces the antiferromagnetic semiconducor EuSe to enter ferromagnetic alignment in the picosecond time scale. A photon generates an electron-hole pair, whose electron forms a supergiant…
Ultralow emittance ($\leq20$ nm, normalized) electron beams with $10^5$ electrons per bunch are obtained by tightly focusing an ultrafast ($\sim$ 100 fs) laser pulse on the cathode of a 1.6 cell radiofrequency photoinjector. Taking…
Ferromagnetic resonance has been used to study the magnetic properties and magnetization dynamics of polycrystalline Fe$_{1-x}$V$_{x}$ alloy films with $0\leq x < 0.7$. Films were produced by co-sputtering from separate Fe and V targets,…
We have made an observation of 45 MeV electron beam bunches using the nondestructive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with the…
In this paper we discuss a method for nondestructive measurements of the longitudinal profile of sub-picosecond electron bunches for X-Ray Free Electron Lasers (XFELs). The method is based on the detection of the Coherent Synchrotron…
The Photo-Injector Test facility at DESY, Zeuthen site (PITZ), produces pulsed electron beams with low transverse emittance and is equipped with diagnostic devices for measuring various electron bunch properties, including the longitudinal…
Passive optical elements can play key roles in photonic applications such as plasmonic integrated circuits. Here we experimentally demonstrate passive gap-plasmon focusing and routing in two-dimensions. This is accomplished using a high…
We propose a physical design of a compact all optical terahertz (THz)-driven electron source. The 300 mm accelerator beamline, powered by Joule level laser system, is easily to be integrated to tabletop scale. A dual-feed THz-driven…
Single-electron detectors are a key component of electron microscopes and advanced electron optics experiments. We present a YAG:Ce scintillator-based single-electron detector with a spatial resolution of 1 micrometer at an electron energy…
Laser-plasma acceleration is an emerging technique for accelerating electrons to high energies over very short distances. The accelerated electron bunches have femtosecond duration, making them particularly relevant for applications such as…
We demonstrate the measurement of single-shot spectra of temporally selected micropulses from a mid-infrared (MIR) free-electron laser (FEL) by upconversion. We achieve the upconversion of FEL pulses at 11 \mu m using externally…
We report a method for acquiring Foucault images and small-angle electron diffraction patterns in external magnetic fields using a conventional transmission electron microscope without any modification. In the electron optical system that…
Precise control of light-matter interactions at the nanoscale lies at the heart of nanophotonics. Experimental examination at this length scale is challenging, however, since the corresponding electromagnetic near-field is often confined…
Terahertz imaging holds great potential for non-destructive material inspection, but practical implementation has been limited by resolution constraints. In this study, we present a single-pixel THz imaging system based on a confocal…
In state of the art photoinjector electron sources, thermal emittance from photoemission dominates the final injector emittance. Therefore, low thermal emittance cathode developments and diagnostics are very important. Conventional thermal…
We propose and theoretically demonstrate a technique that allows one to compensate for chromatic aberrations of traditional electron lenses in ultrafast electron microscopes. The technique is based on space- and time-dependent phase…