Related papers: Lattice strain and tilt mapping in stressed Ge mic…
The properties of Van der Waals heterostructures are determined by the twist angle and the interface between adjacent layers as well as their polytype and stacking. Here we describe the use of spectroscopic Low Energy Electron Microscopy…
Moir\'e superlattice in two-dimensional (2D) materials provides a powerful platform to engineer emergent electronic states, yet the construction of moir\'e superlattices remains lab-scale, involving much trial and error and with little…
Magnetoelectric coupling terms are derived in piezoelectric/magnetostrictive (multiferroic) thin film heterostructures using Landau-Ginzburg free energy expansions in terms of strain and by considering strain boundary conditions between the…
We construct an electron optical system to investigate Bragg diffraction (the crystal lattice plane, $10^{-2}$-$10^{-3}$ rad) with the objective lens turned off by adjusting the current in the intermediate lenses. A crossover was located on…
Lattice deformations in graphene couple to the low-energy electronic degrees of freedom as effective scalar and gauge fields. Using molecular dynamics simulations, we show that the optical component of the displacement field, i.e., the…
Synchrotron Laue microdiffraction and Digital Image Correlation measurements were coupled to track the elastic strain field (or stress field) and the total strain field near a general grain boundary in a bent bicrystal. A 316L stainless…
This Paper introduces a new Non-Contact, Optical method for displacement measurements, and strain mapping as well as comparing it to traditional Digital Image correlation (DIC) and laser interferometry measurement method. This Method…
In this study, we experimentally investigate the photonic dispersion in one-dimensional moir\'e structures formed by stacking two photonic crystal slabs with slightly different periods, separated by a carefully controlled subwavelength…
In the Cu Cr system, the formation of supersaturated solid solutions can be obtained by severe plastic deformation. Energy dispersive synchrotron diffraction measurements on as deformed Cu Cr samples as a function of the applied strain…
We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave. Using a fiber interferometer, we found that the strain changes sign across the…
The electrochemical growth of Au nanowires in a template of nano-porous anodic aluminum oxide was investigated in situ by means of grazing-incidence transmission small- and wide-angle x-ray scattering (GTSAXS and GTWAXS), x-ray fluorescence…
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the measurement accuracy is approaching nine significant digits, a…
The optical transmission matrix (TM) characterizes the transmission properties of a sample. We show a novel experimental procedure for measuring the TM of light waves in a slab geometry based on sampling the light field on a hexagonal…
A novel laser molecular beam epitaxy (LMBE) system for the fabrication of atomically controlled oxides superlattices and an x-ray diffractometer that measures spatially-resolved x-ray diffraction spectra have been developed based on the…
Nanoscale control of optical dispersion is essential for applications ranging from miniaturized spectrometers to color printing, all of which demand broadband spectral tunability. However, the Kramers-Kronig relations impose a fundamental…
We depict the use of x-ray diffraction as a tool to directly probe the strain status in rolled-up semiconductor tubes. By employing continuum elasticity theory and a simple model we are able to simulate quantitatively the strain relaxation…
Wehrenberg et. al. [Nature 550 496 (2017)] used ultrafast in situ x-ray diffraction at the LCLS x-ray free-electron laser facility to measure large lattice rotations resulting from slip and deformation twinning in shock-compressed…
A perfectly compliant substrate would allow the monolithic integration of high-quality semiconductor materials such as Ge and III-V on Silicon (Si) substrate, enabling novel functionalities on the well-established low-cost Si technology…
The patterned design of flexible sensors enables customized performance to meet diverse application demands. However, when multiple geometric parameters and sensing metrics are involved, experimental approaches to establish…
Coded apertures, traditionally employed in x-ray astronomy for imaging celestial objects, are now being adapted for micro-scale applications, particularly in studying microscopic specimens with synchrotron light diffraction. In this paper,…