Related papers: Low-voltage coherent electron imaging based on a s…
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that overcomes the limitations imposed by coherent aberrations. The…
Surgical tumor resection aims to remove all cancer cells in the tumor margin and at centimeter-scale depths below the tissue surface. During surgery, microscopic clusters of disease are intraoperatively difficult to visualize and are often…
We demonstrate experimentally and theoretically that a coherent image of a pure phase object may be obtained by use of a spatially incoherent illumination beam. This is accomplished by employing a two-beam source of entangled photons…
Complex-field imaging is indispensable for numerous applications at wavelengths from X-ray to THz, with amplitude describing transmittance (or reflectivity) and phase revealing intrinsic structure of the target object. Coherent diffraction…
Real-space imaging of three-dimensional atomic structures is a critical yet challenging task in materials science. Although scanning transmission electron microscopy has achieved sub-angstrom lateral resolution through techniques like…
Coherent interactions between electromagnetic and matter waves lie at the heart of quantum science and technology. However, the diffraction nature of light has limited the scalability of many atom-light based quantum systems. Here, we use…
We introduce an approach for performing spectrally resolved electron microscopy without the need for an electron spectrometer. The method involves an electron beam prepared as a coherent superposition of multiple paths, one of which passes…
Thin-film based phase plates are meanwhile a widespread tool to enhance the contrast of weak-phase objects in transmission electron microscopy (TEM). The thin film usually consists of amorphous carbon, which suffers from quick degeneration…
A new iterative image reconstruction algorithm for electrical capacitance tomography (ECT) is proposed that is based on iterative soft thresholding of a total variation penalty and adaptive reweighted compressive sensing. This algorithm…
We present an imaging technique that allows the recovery of the transparency profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM),…
Multidimensional coherent optical spectroscopy is one of the most powerful tools for investigating complex quantum mechanical systems. While it was conceived decades ago in magnetic resonance spectroscopy using micro- and radio-waves, it…
An outstanding question in X-ray single particle imaging experiments has been the feasibility of imaging sub 10-nm-sized biomolecules under realistic experimental conditions where very few photons are expected to be measured in a single…
Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…
To date, high-resolution electron microscopy has largely relied on using the phase of the exit wave function at the exit surface to form a high-resolution electron microscopic image. We have for the first time used chromatic aberration…
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at approximately 480…
Diffraction of atoms from surfaces provides detailed insights into structures, interactions, and dynamical processes. However, currently the method is limited to measurements in reflection - diffraction through materials has only been…
We present diffraction patterns from micron-sized areas of mono-crystalline graphite obtained with an ultracold and ultrafast electron source. We show that high spatial coherence is manifest in the visibility of the patterns even for…
We report our detailed investigation of high-resolution imaging using secondary electrons (SE) with a subnanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire…
We discuss a new approach to three-dimensional electrical impedance imaging based on a reduction of the information to be demanded from a reconstruction algorithm. Images are obtained from a single measurement by suitably simplifying the…
Important recent advances in transmission electron microscopy instrumentation and capabilities have made it indispensable for atomic-scale materials characterization. At the same time, the availability of two-dimensional materials has…