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Measurements of the drift velocities of electrons and holes as functions of electric field and temperature in high-purity n- and p-type silicon with <100> orientation are presented. The measurements cover electric field values between 2.5…

Instrumentation and Detectors · Physics 2015-08-20 Christian Scharf , Robert Klanner

The mobility of electrons and holes in silicon depends on many parameters. Two of them are the electric field and the temperature. It has been observed previously that the mobility in the transition region between ohmic transport and…

Instrumentation and Detectors · Physics 2011-08-16 Julian Becker , Eckhart Fretwurst , Robert Klanner

We describe a straight-forward method for determining the transfer function of the readout of a sensor for the situation in which the current transient of the sensor can be precisely simulated. The method relies on the convolution theorem…

Instrumentation and Detectors · Physics 2015-10-22 Christian Scharf , Robert Klanner

The low-field carrier mobilities in <100> silicon were quantified as a function of the 1$\,$MeV neutron-equivalent fluence up to $10^{18}\,$cm$^{-2}$ and for temperatures between 230$\,$K and 260$\,$K. Current measurements were fitted using…

Instrumentation and Detectors · Physics 2026-05-19 I. Bloch , B. Bruers , C. -T. Klein , H. Lacker , P. Li , M. Ullan , Y. Unno , I. Mandić , C. Scharf

The effects of very low temperature on the electron transport in a [110] and [100] axially aligned unstrained silicon nanowires (SiNWs) are investigated. A combination of semi-empirical 10-orbital tight-binding method, density functional…

Mesoscale and Nanoscale Physics · Physics 2025-01-03 Daryoush Shiri , Reza Nekovei , Amit Verma

We use all-electrical methods to inject, transport, and detect spin-polarized electrons vertically through a 350-micron-thick undoped single-crystal silicon wafer. Spin precession measurements in a perpendicular magnetic field at different…

Materials Science · Physics 2009-11-13 Biqin Huang , Douwe J. Monsma , Ian Appelbaum

The collection of charge carriers generated in p+n strip sensors close to the Si-SiO2 interface before and after 1 MGy of X-ray irradiation has been investigated using the transient current technique with sub-nanosecond focused light pulses…

Instrumentation and Detectors · Physics 2013-05-03 Thomas Poehlsen , Eckhart Fretwurst , Robert Klanner , Joern Schwandt , Jiaguo Zhang

The parameter-free computation of charge transport properties of semiconductors is now routine owing to advances in the ab-initio description of the electron-phonon interaction. Many studies focus on the low-field regime in which the…

Materials Science · Physics 2023-01-18 David Catherall , Austin Minnich

Current-voltage dependence is measured in (Ga,Sb)-doped ZnO up to 150 kV/cm electric fields. A channel temperature is controlled by applying relatively short (few ns) voltage pulses to two-terminal samples. The dependence of electron drift…

We present direct imaging measurements of charge transport across a 1 cm x 1 cm x 4 mm-thick crystal of high purity silicon ($\sim$15 k$\Omega$-cm) at temperatures of 5 K and 500 mK. We use these data to measure the lateral diffusion of…

The present study examines the electronic transport characteristics of amorphous semiconductors through TOF measurements and numerical simulations. The primary objective is to determine the DOS in amorphous selenium (a-Se) and to assess the…

Materials Science · Physics 2025-12-29 F. Serdouk , A. Boumali , M. L. Benkhedir , Y. Goutal

Silicon carbide (SiC) has been widely adopted in the semiconductor industry, particularly in power electronics, because of its high temperature stability, high breakdown field, and fast switching speeds. Its wide band gap makes it an…

Thermal transient measurement based on source-drain voltage is a standard method to characterize thermal properties of silicon semiconductors but is doubtful to be directly applied to silicon carbide (SiC) devices. To evaluate its…

Applied Physics · Physics 2022-11-29 Yi Zhang , Yichi Zhang , Zhiliang Xu , Zhongxu Wang , Hon Wong , Zhebie Lu , Antonio Caruso

A method is proposed for determining the electric field in highly-irradiated silicon pad diodes using admittance-frequency (Y-f ), and current measurements (I). The method is applied to Y-f and I data from square n+p diodes of 25mm2 area…

Instrumentation and Detectors · Physics 2022-03-02 R. Klanner , J. Schwandt

The transport properties of hot holes in silicon at cryogenic temperatures exhibit several anomalous features, including the emergence of two distinct saturated drift velocity regimes and a non-monotonic trend of the current noise versus…

Materials Science · Physics 2023-06-28 David S. Catherall , Austin J. Minnich

The quality of the silicon-oxide interface plays a crucial role in fabricating reproducible silicon spin qubits. In this work we characterize interface quality by performing mobility measurements on silicon Hall bars. We find a peak…

A method is presented which allows to obtain the position-dependent electric field and charge density by fits to velocity profiles from edge-TCT data from silicon strip-detectors. The validity and the limitations of the method are…

Instrumentation and Detectors · Physics 2020-01-08 R. Klanner , G. Kramberger , I. Mandic , M. Mikuz , M. Milovanovic , J. Schwandt

A theoretical study on the nonlinear transport of holes in the transient and steady state of p-doped 4H-SiC under the influence of high electric fields is presented. It is based on a nonlinear quantum kinetic theory which provides a clear…

Materials Science · Physics 2021-10-06 Jackelinne L. Vasconcelos , Clóves Gonçalves Rodrigues , Roberto Luzzi

Structural phase transitions and soft phonon modes pose a longstanding challenge to computing electron-phonon (e-ph) interactions in strongly anharmonic crystals. Here we develop a first-principles approach to compute e-ph scattering and…

Materials Science · Physics 2018-12-04 Jin-Jian Zhou , Olle Hellman , Marco Bernardi

The temperature dependences of the conductivity \sigma(T) for strongly interacting 2D electron system in silicon have been analyzed both in zero magnetic field and in spin-polarizing magnetic field of 14.2T, parallel to the sample plane.…

Strongly Correlated Electrons · Physics 2009-11-11 D. A. Knyazev , O. E. Omelyanovskii , A. S. Dormidontov , V. M. Pudalov
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