Related papers: Color Atomic Force Microscopy with on-the-fly Mors…
We present a method for recovery of narrow homogeneous spectral features out of broad inhomogeneous overlapped profile based on second-derivative processing of the absorption spectra of alkali metal atomic vapor nanocells. The method is…
Despite being the main tool to visualize molecules at the atomic scale, AFM with CO-functionalized metal tips is unable to chemically identify the observed molecules. Here we present a strategy to address this challenging task using deep…
Band profiles of electronic devices are of fundamental importance in determining their properties. A technique that can map the band profile of both the interior and edges of a device at the nanometer scale is highly demanded. Conventional…
Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…
We present a new adaptive resolution technique for efficient particle-based multiscale molecular dynamics (MD) simulations. The presented approach is tailor-made for molecular systems where atomistic resolution is required only in spatially…
With the invention of scanning probe techniques, direct imaging of single atoms and molecules became possible. Today, scanning tunnelling microscopy (STM) routinely provides angstrom-scale image resolution. At the same time, however, STM…
The contributions of this thesis stem from technology developed to analyse large sets of volumetric images in terms of atom-like features extracted in 3D image space, following SIFT algorithm in 2D image space. New feature properties are…
We demonstrate the stimulated Raman near-field microscopy of few molecules, measured only using near-field optical forces thereby eliminating the need for far-field optical detection. The molecules were excited in the near-field without…
Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…
The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental…
Light-field microscopy (LFM) is a 3D microscopy technique whereby volumetric information of a sample is gained by simultaneously capturing both the position and momentum (angular) information of light illuminating a scene. Conventional LFM…
The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…
In this paper we propose a dark-state-based trapping strategy to break the optical diffraction limit for microscopy. We utilize a spatially dependent coupling field and a probe laser field with temporal and spatial modulation to interact…
Quantum control of atoms at ultrashort distances from surfaces would open a new paradigm in quantum optics and offer a novel tool for the investigation of near-surface physics. Here, we investigate the motional states of atoms that are…
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…
Spin polarized atomic ensembles can be used for the precise measurement of magnetic field. Conventional atomic magnetometers have demonstrated high sensitivities, albeit at low detection bandwidth, fundamentally limited by the Larmor…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
Atomic Force Microscopy (AFM) enables high-resolution surface imaging at the nanoscale, yet the output is often degraded by artifacts introduced by environmental noise, scanning imperfections, and tip-sample interactions. To address this…
We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…
Frequency agile radar (FAR) is known to have excellent electronic counter-countermeasures (ECCM) performance and the potential to realize spectrum sharing in dense electromagnetic environments. Many compressed sensing (CS) based algorithms…