With the invention of scanning probe techniques, direct imaging of single atoms and molecules became possible. Today, scanning tunnelling microscopy (STM) routinely provides angstrom-scale image resolution. At the same time, however, STM images suffer from a serious drawback - the absence of chemical information. Here we demonstrate a modification of STM that resolves the chemical structure of molecular adsorbates. The key to the new STM mode is a combined force sensor and signal transducer that is formed within the tunnelling junction when a suitable gas condenses there. The method probes the repulsive branch of the surface adsorption potential and transforms the force signal into a current. Obtained images achieve the same resolution as state-of-the-art atomic force microscopy (AFM). In contrast to AFM, however, our (uncalibrated) force sensor is of nanoscale dimensions and therefore intrinsically insensitive to those long-range interactions that make atomic-resolution AFM so demanding.
@article{arxiv.0910.5825,
title = {Resolving chemical structures in scanning tunnelling microscopy},
author = {C. Weiss and C. Wagner and C. Kleimann and F. S. Tautz and R. Temirov},
journal= {arXiv preprint arXiv:0910.5825},
year = {2024}
}
Comments
Main text: 14 pages including references and captions, 4 figures. Supplementary information: 1 pages including 2 figures