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Scanning probe microscopy using nitrogen vacancy (NV) centers in diamond has become a versatile tool with applications in physics, chemistry, life sciences and earth and planetary sciences. However, the fabrication of diamond scanning…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…
Atomic force microscopy (AFM or SPM) imaging is one of the best matches with machine learning (ML) analysis among microscopy techniques. The digital format of AFM images allows for direct utilization in ML algorithms without the need for…
We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…
This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…
The microfluidic optomechanical resonator (uFOMR) based on a thin-walled glass capillary supports high Q-factor (>1000) mechanical modes in the presence of liquids. In this Letter, the sensitivity of the uFOMR to the surface change is…
Atomic force microscopes have proved to be fundamental research tools in many situations where a gentle imaging process is required, and in a variety of environmental conditions, such as the study of biological samples. Among the possible…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
We present an interferometric sensor for investigating macroscopic quantum mechanics on a table-top scale. The sensor consists of pair of suspended optical cavities with a finesse in excess of 100,000 comprising 10 g fused-silica mirrors.…
We describe an ultra-sensitive atomic magnetometer using optically-pumped potassium atoms operating in spin-exchange relaxation free (SERF) regime. We demonstrate magnetic field sensitivity of 160 aT/Hz$^{1/2}$ in a gradiometer arrangement…
A trace gas sensor, based on quartz-enhanced photoacoustic spectroscopy (QEPAS), consisting of two acoustically coupled micro-resonators (mR) with an off-axis 20 kHz quartz tuning fork (QTF) is demonstrated. The complete acoustically…
Weak measurement (WM) with state pre- and post-selection can amplify otherwise undetectable small signals and thus promise great potentials in precision measurements. Although frequency measurements offer the hitherto highest precision…
Classical sensors for spectrum analysis are widely used but lack micro- or nanoscale spatial resolution. On the other hand, quantum sensors, capable of working with nanoscale precision, do not provide precise frequency resolution over a…
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…
Sensors based on whispering gallery resonators have minute footprints and can push achievable sensitivities and resolutions to their limits. Here, we use a microbubble resonator, with a wall thickness of 500 nm and an intrinsic Q-factor of…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…
Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…
The significant optical and size benefits of using a curved focal surface for imaging systems have been well studied yet never brought to market for lack of a high-quality, mass-producible, curved image sensor. In this work we demonstrate…