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IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…

In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a…

The native structures of proteins, except for notable exceptions of intrinsically disordered proteins, in general take their most stable conformation in the physiological condition to maintain their structural framework so that their…

Biomolecules · Quantitative Biology 2021-10-26 Lyman Monroe , Daisuke Kihara

The torsional vibration of atomic force microscope (AFM) cantilevers is critical for high-sensitivity measurements, yet existing models for width-varying cantilevers often rely on approximations that lead to significant discrepancies with…

Applied Physics · Physics 2025-11-25 Le Tri Dat , Nguyen Duy Vy

Unusually high bending flexibility has been recently reported for DNA on short length scales. We use atomic force microscopy (AFM) in solution to obtain a direct estimate of DNA bending statistics for scales down to one helical turn. It…

Biomolecules · Quantitative Biology 2014-07-22 Alexey K. Mazur , Mounir Maaloum

Since the inception of the atomic force microscope AFM, dynamic methods have been very fruitful by establishing methods to quantify dissipative and conservative forces in the nanoscale and by providing a means to apply gentle forces to the…

Mesoscale and Nanoscale Physics · Physics 2021-04-14 Sergio Santos , Karim Gadelrab , Chia-Yun Lai , Tuza Olukan , Josep Font , Victor Barcons , Albert Verdaguer , Matteo Chiesa

This work is a theoretical investigation of the stability of the non-linear behavior of an oscillating tip-cantilever system used in dynamic force microscopy. Stability criterions are derived that may help to a better understanding of the…

Atomic and Molecular Clusters · Physics 2016-08-16 Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is…

Applied Physics · Physics 2020-09-15 Sina Eftekhar , Seyyed Mostafa Mousavi Janbeh Sarayi

We discuss theoretically the concept of spatial resolution in near-field scanning optical microscopy (NSOM) in light of a recent work [Opt. Express 17 (2009) 19969] which reported on the achievement of active tips made of a single…

Quantum Physics · Physics 2015-06-18 A. Drezet , A. Cuche , S. Huant

Atomic Force Microscopy has enabled 2D imaging at the sub-molecular level, and 3D mapping of the potential field. However, fast identification of the surface still remains a challenging topic. In this paper, as a step towards implementation…

Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…

Mesoscale and Nanoscale Physics · Physics 2014-12-09 Simon Carpentier , Mario S. Rodrigues , Joël Chevrier

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

We demonstrate the quantitative measurement of the magnetization of individual magnetic nanoparticles (MNP) using a magnetic force microscope (MFM). The quantitative measurement is realized by calibration of the MFM signal using an MNP…

Mesoscale and Nanoscale Physics · Physics 2010-02-22 Kai-Felix Braun , Sibylle Sievers , Dietmar Eberbeck , Stefan Gustafsson , Eva Olsson , Hans Werner Schumacher , Uwe Siegner

High-frequency atomic force microscopy has enabled extraordinary new science through large bandwidth, high speed measurements of atomic and molecular structures. However, traditional optical detection schemes restrict the dimensions, and…

Mesoscale and Nanoscale Physics · Physics 2014-03-11 C. Doolin , P. H. Kim , B. D. Hauer , A. J. R MacDonald , J. P Davis

We present a theory for analyzing residence times of single molecules in a fixed detection area of a scanning tunneling microscope (STM). The approach is developed for one-dimensional molecule diffusion and can be extended to two dimensions…

Mesoscale and Nanoscale Physics · Physics 2022-08-23 Christoph Schiel , Philipp Rahe , Philipp Maass

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance…

Soft Condensed Matter · Physics 2009-11-07 H. Schiessel , G. Oshanin , A. M. Cazabat , M. Moreau

A method to measure the viscosity of liquids at microscales is presented. It uses a thin glass fiber fixed on the tip of the cantilever of an extremely low noise Atomic Force Microscope (AFM), which accurately measures the cantilever…

Soft Condensed Matter · Physics 2013-11-12 Clemence Devailly , Justine Laurent , Audrey Steinberger , Ludovic Bellon , Sergio Ciliberto

In this work, we show that by varying the experimental conditions, the driving amplitude, a dynamic force microscope allows DNA properties to be selectively imaged. The substrate on which the DNA is fixed is a silica surface grafted with…

Biological Physics · Physics 2016-08-16 Laurent Nony , Rodolphe Boisgard , Jean-Pierre Aimé

The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…

Instrumentation and Detectors · Physics 2007-05-23 P. Fraundorf , J. Tentschert

Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…

Materials Science · Physics 2022-10-18 Lex Pillatsch , Szilvia Kalácska , Xavier Maeder , Johann Michler
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