Related papers: In-situ Piezoresponse Force Microscopy Cantilever …
An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific disciplines such as molecular engineering, solid-state physics,…
Ferroelectric domain walls have emerged as one of the most fascinating objects in condensed matter physics due to the broad variability of functional behaviors they exhibit. However, the vast majority of domain walls studies have been…
In a previous publication we demonstrated that the stable and unstable equilibrium states of prismatic Coulomb actuated Euler-Bernoulli micro-beams, clamped at both ends, can successfully be simulated combining finite element analysis (FEM)…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Characterizing these defects is an important step towards…
The purpose of this paper is to apply characteristics of residual stress that causes cantilever beams to bend for manufacturing a micro-structured gas flow sensor. This study uses a silicon wafer deposited silicon nitride layers,…
In this paper, we study the behaviour of a microcantilever beam under electrostatic actuation using finite difference method. This problem has a lot of applications in MEMS based devices like accelerometers, switches and others. In this…
Piezoresponse force microscopy (PFM) has been extensively utilized as a versatile and an indispensable tool to understand and analyze nanoscale ferro- /piezoelectric properties by detecting the local electromechanical response on a sample…
Sensitive transduction of the motion of a microscale cantilever is central to many applications in mass, force, magnetic resonance, and displacement sensing. Reducing cantilever size to nanoscale dimensions can improve the bandwidth and…
Domain-wall dynamics in ferroelectric materials are strongly position-dependent since each polar interface is locked into a unique local microstructure. This necessitates spatially resolved studies of the wall-pinning using scanning-probe…
A simulation of an atomic force microscope operating in the constant amplitude dynamic mode is described. The implementation mimics the electronics of a real setup including a digital phase-locked loop (PLL). The PLL is not only used as a…
The sensitivity of phase-sensitive detectors, such as piezoelectric detectors, becomes increasingly directional as the detector element size increases. In contrast, pyroelectric sensors, which are phase-insensitive, retain their…
We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
We investigate the possibility of an electromechanical which-path interferometer, in which electrons travelling through an Aharonov-Bohm ring incorporating a quantum dot in one of the arms are dephased by an interaction with the fundamental…
The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning…
In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
A multiphase flowmeter (MPFM) is used in the upstream oil and gas industry for continuous, in-line, real-time, oil-gas-water flow measurement without fluid separation. An MPFM typically consists of phase-fraction (holdup) and velocity (or…