Related papers: Scanning capacitance microscopy using a relaxation…
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm above the samplewith the help of Scanning Tunneling Microscope…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded…
A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…
Preparing and manipulating quantum states of mechanical resonators is a highly interdisciplinary undertaking that now receives enormous interest for its far-reaching potential in fundamental and applied science. Up to now, only nanoscale…
The new generation of strained silicon nitride resonators harbors great promise for scanning force microscopy, especially when combined with the extensive toolbox of cavity optomechanics. However, accessing a mechanical resonator inside an…
We show that a scanning capacitance microscope (SCM) can image buried delta-doped donor nanostructures fabricated in Si via a recently developed atomic-precision scanning tunneling microscopy (STM) lithography technique. A critical…
Progress in spintronics has been aided by characterization tools tailored to certain archetypical materials. New device structures and materials will require characterization tools that are material independent, provide sufficient…
Nuclear spin-lattice relaxation times are measured on copper using magnetic resonance force microscopy performed at temperatures down to 42 mK. The low temperature is verified by comparison with the Korringa relation. Measuring spin-lattice…
We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system's resonant frequency, we obtain quantitative topographic images of uniformly conducting…
The knowledge of capacitance in semiconductor micro-strip detectors is important for a correct design, simulation and understanding of the detectors. Analytical approaches can efficiently complement numerical methods providing quick results…
Recent years have seen great progress in our understanding of the electronic properties of nanomaterials in which at least one dimension measures less than 100 nm. However, contacting true nanometer scale materials such as individual…
Capacitance measurement is a useful technique in studying quantum devices, as it directly probes the local particle charging properties, i.e. the system compressibility. Here we report one approach which can measure capacitance from mK to…
Using light to measure an object's motion is central to operating mechanical sensors that probe forces and fields. Cavity optomechanical systems embed mechanical resonators inside optical resonators. This enhances the sensitivity of…
We report a capacitance tracking method for achieving arbitrary polarization rotation from nematic liquid crystals. By locking to the unique capacitance associated with the molecular orientation, any polarization rotation can be achieved…
High-precision laser interferometric instruments require optical surfaces with a close to perfect contour, as well as low scattering and absorption. Especially point absorbers are problematic because they heat up at high optical intensities…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Scanning ion conductance microscopy (SICM) can image the surface topography of specimens in ionic solutions without mechanical probe--sample contact. This unique capability is advantageous for imaging fragile biological samples but its…
A scanning force microscope was implemented operating at temperatures below 4.2K and in magnetic fields up to 8T. Piezoelectric quartz tuning forks were employed for non optical tip-sample distance control in the dynamic operation mode.…
We present the design and optimization of a Tomographic Gamma Scanning (TGS) collimator based on Monte Carlo simulations using MCNP5 computer code. In these simulations, an accurate Monte Carlo model of TGS was built and the collimator…