Related papers: An Efficient monochromatic Electron Source designe…
A high-current electron source for inverse photoemission spectroscopy (IPES) is described. The source comprises a thermal cathode electron emission system, an electrostatic deflector-monochromator, and a lens system for variable kinetic…
Monochromators are an essential component in electron microscopy and spectroscopy for enhancing the spatial and energy resolution. However, its adoption in scanning electron microscopes remains limited because of its high cost and…
We describe the design and performance of a magnetic bottle electron spectrometer~(MBES) for high-energy electron spectroscopy. Our design features a ${\sim2}$~m long electron drift tube and electrostatic retardation lens, achieving…
Resonant radiofrequency cavities enable exquisite time-energy control of electron beams when synchronized with laser driven photoemission. We present a lossless monochromator design that exploits this fine control in the…
An alternative approach to the image simulation in high resolution transmission electron microscopy (HRTEM) is introduced after comparative analysis of the existing image simulation methods. The alternative method is based on considering…
A new methodology for the improvement of the performance of inexpensive static passive electromagnetic skins (SP-EMSs) is presented. The proposed approach leverages on the non-uniqueness of the inverse source problem associated to the…
Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…
A new spin- and angle-resolved inverse photoemission setup with a low-energy electron source is presented. The spin-polarized electron source, with a compact design, can decouple the spin polarization vector from the electron beam…
Low voltage scanning electron microscopy is a powerful tool for examining surface features and imaging beam sensitive materials. Improving resolution during low voltage imaging is then an important area of development. Decreasing the effect…
Inverse photoelectron spectroscopy (IPES) is a powerful technique for probing the unoccupied electronic states of materials. It can be regarded as the inversion process of photoelectron spectroscopy (PES), which examines the occupied…
A synchrotron radiation beamline in the photon energy range of 18 - 240 eV and an electron spectroscopy end station have been constructed at the 3 GeV Diamond Light Source storage ring. The instrument features a variable polarisation…
Solid-state single-photon emitters (SPEs) such as the bright, stable, room-temperature defects within hexagonal boron nitride (hBN) are of increasing interest for quantum information science applications. To date, the atomic and electronic…
Probing optical excitations with high resolution is important for understanding their dynamics and controlling their interaction with other photonic elements. This can be done using state-of-the-art electron microscopes, which provide the…
A laser-based angle resolved photoemission (APRES) system utilizing 6 eV photons from the fourth harmonic of a mode-locked Ti:sapphire oscillator is described. This light source greatly increases the momentum resolution and photoelectron…
A compact Inverse Compton Light Source (ICLS) design is presented, with flux and brilliance orders of magnitude beyond conventional laboratory-scale sources and other compact ICLS designs. This design utilizes the physics of inverse Compton…
Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections…
Photoemission (PES) and inverse-photoemission spectra (IPES) for the sulphur-passivated InP(001) surface are compared with theoretical predictions based on density-functional calculations. As a test case for our methods, we also present a…
Scanning Microwave Impedance Microscopy (MIM) measurement of photoconductivity with 50 nm resolution is demonstrated using a modulated optical source. The use of a modulated source allows for measurement of photoconductivity in a single…
A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…