Related papers: System analysis of Force Feedback Microscopy
This note analyzes incoherent feedforward loops in signal processing and control. It studies the response properties of IFFL's to exponentially growing inputs, both for a standard version of the IFFL and for a variation in which the output…
A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…
Nonlinear controllers for floating base systems in contact with the environment are often framed as quadratic programming (QP) optimization problems. Common drawbacks of such QP based controllers are: the control input often experiences…
In order to be effective partners for humans, robots must become increasingly comfortable with making contact with their environment. Unfortunately, it is hard for robots to distinguish between ``just enough'' and ``too much'' force: some…
This paper presents the design of a robust controller for a vehicle air suspension system using Quantitative Feedback Theory (QFT). This study is primarily focused on control of linearized active air suspension system. For the purpose of…
We assume that the sample height measured using AFM is reduced due to contact deformation. The Herz contact theory is applied for the quantitative description. General numerical solution is found. Analytical approximations for specific…
Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element…
It is generally thought that capillary interactions in nanoscale contacts give rise to unwanted behaviour due to high adhesion. We show that this is not the case for sufficiently small contacts in ambient conditions. High resolution ambient…
We experimentally surpass the 3dB limit to steady state parametric squeezing of a mechanical oscillator. The localization of a AFM cantilever, achieved by optimal estimation, is enhanced by up to 6.2 dB in one position quadrature when a…
Sensing a magnetic field with an atomic magnetometer operated in real time presents significant challenges, primarily due to sensor non-linearity, the presence of noise, and the need for one-shot estimation. To address these challenges, we…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…
We present a theoretical study of the dynamics of a tip scanning a graphite surface as a function of the applied load. From the analysis of the lateral forces, we extract the friction force and the corrugation of the effective tip-surface…
Feedback traps use closed-loop control to trap or manipulate small particles and molecules in solution. They have been applied to the measurement of physical and chemical properties of particles and to explore fundamental questions in the…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…
Soft robotics holds transformative potential for enabling adaptive and adaptable systems in dynamic environments. However, the interplay between morphological and control complexities and their collective impact on task performance remains…