Related papers: Pulse force nanolithography on hard surfaces using…
Sub-picosecond optical laser processing of metals is actively utilized for modification of a heated surface layer. But for deeper modification of different materials a laser in the hard x-ray range is required. Here, we demonstrate that a…
Studying nanoscale dynamics is essential for understanding quantum materials and advancing quantum chip manufacturing. Still, it remains a major challenge to measure non-equilibrium properties such as current and dissipation, and their…
Planar scanning probe microscopy is a recently emerging alternative approach to tip-based scanning probe imaging. It can scan an extended planar sensor, such as a polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy…
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to continuously develop metrology methods in the field of nanotechnology. Contact and interface properties are key parameters that determine the…
At a single atom thick, it is challenging to distinguish graphene from its substrate using conventional techniques. In this paper we show that friction force microscopy (FFM) is a simple and quick technique for identifying graphene on a…
In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a…
In this paper, we propose a non-invasive imaging method of microwave near field using a diamond containing nitrogen-vacancy centers. We applied synchronous pulsed sequence combined with charge coupled device camera to measure the amplitude…
Friction is a complicated phenomenon involving nonlinear dynamics at different length and time scales[1, 2]. The microscopic origin of friction is poorly understood, due in part to a lack of methods for measuring the force on a…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
We fabricated cantilevers for magnetic force microscopy with carbon nanotube tips coated with magnetic material. Images of a custom hard drive demonstrated 20 nm lateral resolution, with prospects for further improvements.
A fluid-based method is demonstrated for preparing graphene nanomeshes (GNMs) directly from pristine graphite flakes by a one-step process. The high efficiency is attributed to the combination of fluid-assisted exfoliation and perforation…
High-\Qm{} mechanical resonators are crucial for applications where low noise and long coherence time are required, as mirror suspensions, quantum cavity optomechanical devices, or nanomechanical sensors. Tensile strain in the material…
Acoustical tweezers based on focused acoustical vortices open some tremendous perspectives for the in vitro and in vivo remote manipulation of millimetric down to micrometric objects, with combined selectivity and applied forces out of…
Electrostatic force microscopy (EFM) can image nanoscale objects buried below the surface. Here, we theoretically show that this capability can be used to obtain nanotomographic information, i.e., the physical dimensions and dielectric…
Surface based geometries of microfabricated wires or patterned magnetic films can be used to magnetically trap and manipulate ultracold neutral atoms or Bose-Einstein condensates. We investigate the magnetic properties of such atom chips…
Coronagraphy is a powerful technique to achieve high contrast imaging and hence to image faint companions around bright targets. Various concepts have been used in the visible and near-infrared regimes, while coronagraphic applications in…
In strained mechanical resonators, the concurrence of tensile stress and geometric nonlinearity dramatically reduces dissipation. This phenomenon, dissipation dilution, is employed in mirror suspensions of gravitational wave interferometers…
We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for electrical probing of nanostructures of interest, and it…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…