In this paper, we propose a non-invasive imaging method of microwave near field using a diamond containing nitrogen-vacancy centers. We applied synchronous pulsed sequence combined with charge coupled device camera to measure the amplitude of the microwave magnetic field. A full reconstruction formulation of the local field vector, including the amplitude and phase, is developed by measuring both left and right circular polarizations along the four nitrogen-vacancy axes. Compared to the raster scanning approach, the two dimensional imaging method is promising for application to circuit failure analysis. A diamond film with micrometer thinness enables high-resolution near field imaging. The proposed method is expected to have applications in monolithic-microwave-integrated circuit chip local diagnosis, antenna characterization, and field mode imaging of microwave cavities and waveguides.
@article{arxiv.1801.01706,
title = {Non-Invasive Imaging Method of Microwave Near Field Based on Solid State Quantum Sensing},
author = {Bo Yang and Guanxiang Du and Yue Dong and Guoquan Liu and Zhenzhong Hu and Yongjin Wang},
journal= {arXiv preprint arXiv:1801.01706},
year = {2018}
}