Related papers: Ellipsometry with polarisation analysis at cryogen…
Controlling polarisation directly at low temperature is crucial for development of optical spectroscopy techniques at sub-Kelvin temperatures, for example, in a hybrid scheme where light is fed into and collected in the cryostat by fibres…
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. However, a conventional ellipsometer, which utilizes a mechanically rotating polarizer and grating-based…
Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnetic structures in a film. While magnetic arrays patterned by…
Next-generation gravitational wave observatories are expected to use cryogenically cooled, pendulum-suspended 200 kg test mass mirrors from a crystalline material such as crystalline silicon. During operation of the observatories, these…
Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of…
A shift of paradigm to obtain (sub-)Kelvin environment is currently on-going with the democratization of cryogen-free cryocoolers, boosted by their easy-to-use and continuous operation without the need of liquid helium whose cost and…
An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…
Sensing light's polarization and wavefront direction enables surface curvature assessment, material identification, shadow differentiation, and improved image quality in turbid environments. Traditional polarization cameras utilize multiple…
In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been worked out among which the method of variation of…
The PVLAS collaboration is at present running, at the Laboratori Nazionali di Legnaro of I.N.F.N., Padova, Italy, a very sensitive optical ellipsometer capable of measuring the small rotations or ellipticities which can be acquired by a…
Measuring the faint polarization signal of the cosmic microwave background (CMB) not only requires high optical throughput and instrument sensitivity but also control over systematic effects. Polarimetric cameras or receivers used in this…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
Free-space circularly polarized light (CPL) detection, requiring polarizers and waveplates, has been well established, while such spatial degree of freedom is unfortunately absent in integrated on-chip optoelectronics. So far, those…
Mm and sub-mm waves polarimetry is the new frontier of research in Cosmic Microwave Background and Interstellar Dust studies. Polarimeters working in the IR to MM range need to be operated at cryogenic temperatures, to limit the systematic…
An atomic magnetometer operated with elliptically polarized light is investigated theoretically and experimentally. To explore the potential of this magnetometric configuration, the analytical form of the outgoing signal is derived.…
The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 microns. The Mueller ellipsometer, which can be mounted in reflection or in transmission configuration,…
This work aims to demonstrate that two arrays of Lumped Element Kinetic Inductance Detectors (LEKIDs), when employed in filled array configuration and separated by an external linear polarizer oriented at 45 degrees, can achieve the…
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…
Reflection measurements give access to the complex impedance of a material on a wide frequency range. This is of interest to study the dynamical properties of various materials, for instance disordered superconductors. However reflection…
We describe a versatile apparatus for optical observations of experimental processes at temperatures down to 0.1 K. The cooling is achieved by a wet cryostat with a dilution refrigerator on a vibrationally-isolated platform, capable of…