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Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy (s-SNOM) provides nanoscale resolution, relying on the…
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…
Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for mid-infrared spectroscopy at nanometer length scales. By investigating objects in aqueous environments through ultrathin membranes, s-SNOM has recently…
Time-resolved scanning near-field optical microscopy (tr-SNOM) enables the measurement of the dynamic optical response of functional surfaces beyond the diffraction limit. Experimental challenges are imposed both by the use of a pulsed…
An atomic force microscope~(AFM) tip, with a few nm-thick noble metal coating, gives rise to strong electric-field at the near-field of tip apex, i.e. hot spot, when illuminated with a beam of light linearly polarized in the axial…
Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy…
Shannon's sampling theorem is one of the cornerstone topics that is well understood and explored, both mathematically and algorithmically. That said, practical realization of this theorem still suffers from a severe bottleneck due to the…
Near-field optical microscopes with two independent tips for simultaneous excitation and detection can be essential tools for studying localized optical phenomena on the subwavelength scale. Here, we report on the implementation of a fully…
Electric field enhancement mediated through sharp tips in scattering-type scanning near-field optical microscopy (s-SNOM) enables optical material analysis down to the 10-nm length scale, and even below. Nevertheless, mostly the…
Point-spread function of the probe forming optics ($PSF_{optics} $) is reported for the first time in an uncorrected (without multipole correctors) scanning electron microscope (SEM). In an SEM, the electron probe information is lost as the…
Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
Phase retrieval is the numerical procedure of recovering a complex-valued signal from knowledge about its amplitude and some additional information. Here, an indirect registration procedure, based on the large deformation diffeomorphic…
We theoretically and experimentally demonstrate a multifrequency excitation and detection scheme in apertureless near field optical microscopy, that exceeds current state of the art sensitivity and background suppression. By exciting the…
In order to solve the problems of waveform distortion and signal delay by many physical and electrical systems with linear low-pass transfer characteristics with multiple complex poles, a general digital-signal-processing (DSP)-based method…
We study the response of a conical metallic surface to an external electromagnetic (EM) field by representing the fields in basis functions containing integrable singularities at the tip of the cone. A fast analytical solution is obtained…
Orthogonal frequency division multiplexing (OFDM) has proven itself as an effective multi-carrier digital communication technique. In recent years the interest in optical OFDM has grown significantly, due to its spectral efficiency and…
Comb-based optical arbitrary waveform measurement (OAWM) techniques can overcome the bandwidth limitations of conventional coherent detection schemes and may have disruptive impact on a wide range of scientific and industrial applications.…