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We present a direct experimental investigation of the optical field distribution around a suspended tapered optical nanofiber by means of a fluorescent scanning probe. Using a 100 nm diameter fluorescent bead as a probe of the field…

With the advent of microsphere assisted microscopy in 2011, this technique emerged as a simple and easy way to obtain optical super-resolution. Although the possible mechanisms of imaging by microspheres are debated in the literature, most…

Optics · Physics 2015-08-27 Navid Farahi

Considering that two-dimensional (2D) molybdenum trioxide has acquired more attention in the last few years, it is relevant to speed up thickness identification of this material. We provide two fast and non-destructive methods to evaluate…

Spatial filtering is an important mechanism to improve the spatial quality of laser beams. Typically, a confocal arrangement of lenses with a diaphragm in the focal plane is used for intracavity spatial filtering. Such conventional…

We achieve high detectivity terahertz sensing using a silicon nitride nanomechanical resonator functionalized with a metasurface absorber. High performances are achieved by striking a fine balance between the frequency stability of the…

The increasing scientific and technological interest in nanoparticles has raised the need for fast, efficient and precise characterization techniques. Powder diffraction is a very efficient experimental method, as it is straightforward and…

Materials Science · Physics 2008-12-02 A. Cervellino , C. Giannini , A. Guagliardi , M. Ladisa

Photon-number squeezing and correlations enable measurement of absorption with an accuracy exceeding that of the shot-noise limit. However, sub-shot noise imaging and sensing based on these methods require high detection efficiency, which…

Quantum Physics · Physics 2019-03-06 E. Knyazev , F. Ya. Khalili , M. V. Chekhova

Unprecedented atomic-scale measurement resolution has recently been demonstrated in single-shot optical localization metrology based on deep-learning analyses of diffraction patterns of topologically structured light scattered from objects.…

Semiconductor nanowire field-effect transistors represent a promising platform for the development of room-temperature (RT) terahertz (THz) frequency light detectors due to the strong nonlinearity of their transfer characteristics and their…

Due to the large surface-to-volume ratio, surface trap states play a dominant role in the optoelectronic properties of nanoscale devices(1-6). Understanding the surface trap states allows us to properly engineer the device surfaces for…

Mesoscale and Nanoscale Physics · Physics 2015-05-07 Yaping Dan

Recently, computational sampling methods have been implemented to spatially characterize terahertz (THz) fields. Previous methods usually rely on either specialized THz devices such as THz spatial light modulators, or complicated systems…

Optics · Physics 2019-06-19 Jiapeng Zhao , Yiwen E , Kaia Williams , Xi-cheng Zhang , Robert Boyd

We present a superpixel method for full spatial phase and amplitude control of a light beam using a digital micromirror device (DMD) combined with a spatial filter. We combine square regions of nearby micromirrors into superpixels by low…

Optics · Physics 2015-06-19 Sebastianus A. Goorden , Jacopo Bertolotti , Allard P. Mosk

The action of a nanoscopic spherically symmetric refractive index profile on a focused Gaussian beam may easily be envisaged as the action of a phase-modifying element, i.e. a lens: Rays traversing the inhomogeneous refractive index field…

Optics · Physics 2011-09-14 Selmke Markus , Braun Marco , Cichos Frank

Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the beam, however, have not progressed to the same degree. There…

Applied Physics · Physics 2019-07-24 Matthew Zotta , Sharadh Jois , Prathamesh Dhakras , Miguel Rodriguez , Ji Ung Lee

Transmission electron microscopy (TEM) is one of the primary tools to show microstructural characterization of materials as well as film thickness. However, manual determination of film thickness from TEM images is time-consuming as well as…

Computer Vision and Pattern Recognition · Computer Science 2021-06-24 Youshan Zhang , Brian D. Davison , Vivien W. Talghader , Zhiyu Chen , Zhiyong Xiao , Gary J. Kunkel

We demonstrate a neutron tomography technique with sub-micrometer spatial resolution. Our method consists of measuring neutron diffraction spectra using a double crystal diffractometer as a function of sample rotation and then using a phase…

Instrumentation and Detectors · Physics 2020-11-13 B. Heacock , D. Sarenac , D. G. Cory , M. G. Huber , J. P. W. MacLean , H. Miao , H. Wen , D. A. Pushin

We focus on the analysis of planar shapes and solid objects having thin features and propose a new mathematical model to characterize them. Based on our model, that we call an epsilon-shape, we show how thin parts can be effectively and…

Computational Geometry · Computer Science 2018-01-09 Daniela Cabiddu , Marco Attene

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

Optical nanofibers confine light to subwavelength scales, and are of interest for the design, integration, and interconnection of nanophotonic devices. Here we demonstrate high transmission (> 97%) of the first family of excited modes…

Optics · Physics 2013-08-12 S. Ravets , J. E. Hoffman , L. A. Orozco , S. L. Rolston , G. Beadie , F. K. Fatemi

We report a new approach for progressive and well-controlled downsizing of nanostructures below the 10 nm scale. Low energetic ion beam (Ar+) is used for gentle surface erosion, progressively shrinking the dimensions with ~ 1 nm accuracy.…

Mesoscale and Nanoscale Physics · Physics 2015-05-13 M. Zgirski , K. P. Riikonen , V. Tuboltsev , P. Jalkanen , T. T. Hongisto , K. Yu Arutyunov