Related papers: Developments in THz range ellipsometry
This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in that information about the physical properties of a sample…
Ellipsometry is a powerful and well-established optical technique used in the characterisation of materials. It works by combining the components of elliptically polarized light in order to draw information about the optical system. We…
We present a new instrumentation and calibration procedure for terahertz time-domain spectroscopic ellipsometry (THz-TDSE) that is a newly established characterization technique. The experimental setup is capable of providing arbitrary…
Speckle patterns observed in coherent optical imaging reflect important characteristic information of the scattering object. To capture speckle patterns, angular resolved or oblique illumination geometries are usually employed in…
Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform…
Full control of the ellipticity of broadband pulses of THz radiation, from linear to left- or right-handed circular polarization, was demonstrated via a 4-pixel photoconductive emitter with an integrated achromatic waveplate. Excellent…
Traditional imaging systems, such as the eye or cameras, image scenes that lie in the direct line-of-sight (LoS). Most objects are opaque in the optical and infrared regimes and can limit dramatically the field of view (FoV). Current…
An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical constants, structural profiles, etc. However, the precise…
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric…
We present a new method for high precision measurements of polarization rotation in the frequency range from 0.2 to 2.2 THz using a fiber coupled time-domain THz spectrometer. A free standing wire-grid polarizer splits THz light into…
Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully…
Coating thickness measurement and inspection of defects beneath optically opaque surfaces are among the most promising commercial applications of the terahertz (THz) imaging technology. However, there are two main sources of complexity in…
High-resolution imaging in the terahertz (THz) spectral range remains fundamentally constrained by the limited numerical apertures of currently existing state-of-the-art imagers, which restricts its applicability across many fields, such as…
A compact terahertz (THz) polarimetric spectrometer and imaging system is demonstrated using polarization-sensitive frequency-selective surfaces (PS-FSS) and rapid, intensity-based detection. Real-time Stokes parameter extraction enables…
We propose a precise ellipsometric method for the investigation of coherent light with a small ellipticity. The main feature of this method is the use of compensators with phase delays providing the maximum accuracy of measurements for the…
With ever increasing availability of terahertz fields, it is important to find suitable detection techniques without compromising the measured dynamic range. Electro-optic terahertz sampling techniques, which are commonly used to detect…
We propose and demonstrate a Terahertz (THz) oscilloscope for recording time information of an ultrashort electron beam. By injecting a laser-driven THz pulse with circular polarization into a dielectric tube, the electron beam is swept…
A precise, accurate, and relatively straightforward in-situ method to measure and control the ellipticity of light resonantly interacting with an atomic vapor is described. The technique can be used to minimize vector light shifts. The…
Spectroscopic ellipsometry is a means to investigate optical and dielectric material responses. Conventional spectroscopic ellipsometry has trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has…
THz time domain spectroscopy is a powerful technique enabling the investigation of different materials in the far-infrared frequency range. Even if nowadays this technique is well established, its application to very thin films remains…