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Related papers: Reverse epitaxy of Ge: ordered and facetted surfac…

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Ion sputtering induced nanoscale pattern formation on Ge (001) surface by 500 eV Ar+ bombardment has been investigated for a wide range of ion incidence angles at temperature of 300 deg.C. A fourfold symmetric topography forms in the…

Mesoscale and Nanoscale Physics · Physics 2019-10-11 Debasree Chowdhury , Debabrata Ghose

Normal incidence 1 keV Ar$^+$ ion bombardment leads to amorphization and ultrasmoothing of Ge at room temperature, but at elevated temperatures the Ge surface remains crystalline and is unstable to the formation of self-organized nanoscale…

Self-organized pattern formation by the process of reverse epitaxial growth has been investigated on GaAs (001) surfaces during 1 keV Ar+ bombardment at target temperature of 450 degC for a wide range of incident angles. Highly ordered…

Materials Science · Physics 2016-08-24 Debasree Chowdhury , Debabrata Ghose

We investigate the morphologies of the Ge(001) surface that are produced by bombardment with a normally incident, broad argon ion beam at sample temperatures above the recrystallization temperature. Two previously-observed kinds of…

Entropy effects substantially modify the growth of self-assembled Ge nanostructures on vicinal Si (001) surfaces. As shown by variable temperature scanning tunneling microscopy, this leads to new types of one dimensional nanostructures that…

Materials Science · Physics 2020-08-19 Christian Grossauer , Vaclv Holy , Gunther Springholz

The morphological evolution and the effect of growth temperature on size, orientation and composition of molecular beam epitaxy grown Ge-Si islands on Si(5 5 12) surfaces have been investigated in the temperature range from room temperature…

Materials Science · Physics 2012-12-06 J. K. Dash , A. Rath , R. R. Juluri , P. V. Satyam

Ion beam irradiation of semiconductors is a method to produce regular periodic nanoscale patterns self-organized on wafer scale. At low temperatures, the surface of semiconductors is typically amorphized by the ion beam. Above a material…

Mesoscale and Nanoscale Physics · Physics 2016-11-22 Martin Engler , Tomáš Škereň , Stefan Facsko

Ripple formation driven by Ehrlich-Schwoebel barrier is evidenced for normal incidence 30 eV Ar+ bombardment of GaAs (001) surface at elevated target temperature. The pattern follows the symmetry of the bombarded crystal surface. The…

Si/Ge heteroepitaxial dots under tensile strain are grown on nanostructured Ge substrates produced by high-temperature flash heating exploiting the spontaneous faceting of the Ge(001) surface close to the onset of surface melting. A very…

Mesoscale and Nanoscale Physics · Physics 2019-04-18 L. Persichetti , M. Fanfoni , B. Bonanni , M. De Seta , L. Di Gaspare , C. Goletti , L. Ottaviano , A. Sgarlata

Topography evolution of Si(100) surface due to oblique incidence low energy ion beam sputtering (IBS) is investigated. Experiments were carried out at different elevated temperatures from 20$^{\circ}$C to 450$^{\circ}$C and at each…

Materials Science · Physics 2016-04-08 Debasree Chowdhury , Biswarup Satpati , Debabrata Ghose

Off-normal low energy ion beam sputtering of solid surfaces often leads to morphological instabilities resulting in the spontaneous formation of ripple structures in nanometer length scales. In the case of Si surfaces at ambient…

Materials Science · Physics 2009-04-09 Safiul A. Mollick , D. Ghose

The morphology evolution of Si (100) surfaces under 1200 eV Ar+ ion bombardment at normal incidence with and without metal incorporation is presented. The formation of nanodot patterns is observed only when the stationary Fe concentration…

Materials Science · Physics 2015-05-18 Jing Zhou , Stefan Facsko , Ming Lu , Wolfhard Moeller

In this paper evolution of silicon surface topography, under low energy ion bombardment, is investigated at higher oblique incident angles in the range of 63\degree-83\degree. Si(100) substrates were exposed to 500 eV argon ions. Different…

Mesoscale and Nanoscale Physics · Physics 2015-06-04 Tanmoy Basu , Jyoti Ranjan Mohanty , T. Som

Recently, the nucleation rate on top of a terrace during the irreversible growth of a crystal surface by MBE has been determined exactly. In this paper we go beyond the standard model usually employed to study the nucleation process, and we…

Materials Science · Physics 2007-05-23 Paolo Politi , Claudio Castellano

Hemispherical amorphous silicon nanoparticles exhibit asymmetric optical scattering for forward illumination (base-to-apex) and backward illumination (apex-to-base). There exists an anapole mode only for backward propagation, not for…

Optics · Physics 2026-05-07 Dheeraj Pratap

In this study we report on a novel two-step epitaxial growth technique that enables a significant improvement of the crystal quality of nitrogen-polar GaN. The starting material is grown on 4{\deg} vicinal sapphire substrates by metal…

Materials Science · Physics 2024-08-06 Pietro Pampili , Vitaly Z. Zubialevich , Peter J. Parbrook

Molecular beam epitaxy of Ge (111) thin films on epitaxial-Gd2O3/Si(111) substrates is reported, along with a systematic investigation of the evolution of Ge growth, and structural defects in the grown epilayer. While Ge growth begins in…

A direct observation of nucleation of Ge hut clusters formed by ultrahigh vacuum molecular beam epitaxy is reported for the first time. The nuclei of the pyramidal and wedge-like clusters have been observed on the wetting layer blocks and…

Mesoscale and Nanoscale Physics · Physics 2010-07-30 Larisa V. Arapkina , Vladimir A. Yuryev

In the Ge on Si model heteroepitaxial system, metal patterns on the silicon surface provide unprecedented control over the morphology of highly ordered Ge islands. Island shape including nanorods and truncated pyramids is set by the metal…

Structural and optical properties of MBE-grown GaAs(001) surface have been studied by reflection high-energy electron diffraction and single-wavelength ellipsometry under dynamic conditions of ramp heating after desorption of passivating…

Materials Science · Physics 2009-11-10 Andrey V. Vasev , Sergey I. Chikichev
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