Related papers: Interpreting motion and force for narrow-band inte…
Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here we report experimental evidence that the…
We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…
Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…
Measuring the mechanical response of liquid interfaces without direct contact remains a major experimental challenge, particularly in liquid-liquid systems where no solid reference exists. Here, we develop a frequency-modulation atomic…
Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…
We consider a simple version of a cyclic adiabatic inversion (CAI) technique in magnetic resonance force microscopy (MRFM). We study the problem: What component of the spin is measured in the CAI MRFM? We show that the non-destructive…
Small-amplitude dynamic atomic force microscopy (dynamic-AFM) in a simple nonpolar liquid was studied through molecular dynamics simulations. We find that within linear dynamics regime, the contact stiffness and damping of the confined film…
Tip enhanced IR spectra and imaging have been widely used in cutting-edge studies for the in-depth understanding of the composition, structure and function of interfaces at the nanoscale. However, molecular monolayer sensitivity has only…
We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…
Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…
Electrostatic force microscopy at cryogenic temperatures was used to probe the electrostatic interaction between a conductive atomic force microscopy tip and electronic charges trapped in an InAs quantum dot. Measurement of the…
The interaction of Na atoms with a surface was probed by inserting a nanofabricated material grating into one arm of an atom interferometer (IFM). This technique permits a direct measurement of the change in phase and coherence of matter…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
Based on a microscopic transport model, we study the origin of nonstatistical Intermediate Mass Fragment ($IMF$) production in semicentral heavy ion collisions at the Fermi energies. We show that a fast, dynamical $IMF$ formation process,…
In this paper, a dynamic model of reconstruction of the shear force $g(t)$ in the Atomic Force Microscopy (AFM) cantilever tip-sample interaction is proposed. The interaction of the cone-shaped cantilever tip with the surface of the…
Accelerator mass spectrometry (AMS) is a widely-used technique with multiple applications, including geology, molecular biology and archeology. In order to achieve a high dynamic range, AMS requires tandem accelerators and large magnets,…
Scanning probe microscopy is often extended beyond topographic imaging to study electrical forces and sample properties, with the most widely used experiment being frequency-modulated Kelvin probe force microscopy. The equations commonly…
We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…