Related papers: Angle-resolved X-ray photoemission electron micros…
In this article we review our angle- and time-resolved photoemission studies (ARPES and trARPES) on various ferropnictides.
Magnetically controlled states in quantum materials are central to their unique electronic and magnetic properties. However, direct momentum-resolved visualization of these states via angle-resolved photoemission spectroscopy (ARPES) has…
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…
Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…
In this paper we discuss a method for nondestructive measurements of the longitudinal profile of sub-picosecond electron bunches for X-Ray Free Electron Lasers (XFELs). The method is based on the detection of the Coherent Synchrotron…
Angle-resolved photoemission spectroscopy (ARPES) is one of most powerful techniques to unravel the electronic properties of layered materials and in the last decades it has lead to a significant progress in the understanding of the band…
Dark-field x-ray microscopy utilizes Bragg diffraction to collect full-field x-ray images of "mesoscale" structure of ordered materials. Information regarding the structural heterogeneities and their physical implications is gleaned through…
Synchrotron-radiation angle-resolved and core-level photoemission spectroscopy are used together to investigate the origin of the two-dimensional electron gas on the surface of single crystal CdO (100) films. A reduction in the…
A new type of objective lens has recently been proposed for use in X-ray photoemission electron microscopes (XPEEMs) and momentum microscopes. Adding a ring electrode concentric with the extractor allows the field in the gap between the…
The angle-resolved photoemission spectroscopy (ARPES) is one powerful experimental technique to study the electronic structure of materials. As many electron materials show unusual many-body correlations, the technique to detect directly…
Recent developments in environmental and liquid cells equipped with electron transparent graphene windows have enabled traditional surface science spectromicroscopy tools, such as X-ray photoelectron spectroscopy (XPS), photoemission…
Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…
Diffraction of light at lateral inhomogenities is a central process in the near-field studies of nanoscale phenomena, especially the propagation of surface waves. Theoretical description of this process is extremely challenging due to…
We have recently demonstrated a very favorable, inexpensive modernization of lab-based x-ray absorption fine structure (XAFS) and high-resolution x-ray emission spectroscopy (XES) using only commercially-available optics and x-ray tube…
We introduce a full field fluorescence imaging technique with axial confinement of about 100 nm at the sample/substrate interface. Contrary to standard surface imaging techniques, this confinement is obtained through emission filtering.…
*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…
X-ray emission spectroscopy is emerging as an important complement to x-ray absorption fine structure spectroscopy, providing a characterization of the occupied electronic density of states local to the species of interest. Here, we present…
Dark-field X-ray microscopy is a new full-field imaging technique that nondestructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. Placing an objective lens in the diffracted beam…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
We describe the design and performance of a magnetic bottle electron spectrometer~(MBES) for high-energy electron spectroscopy. Our design features a ${\sim2}$~m long electron drift tube and electrostatic retardation lens, achieving…