Related papers: How to Measure Forces when the Atomic Force Micros…
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising from system noise, a deep understanding of MDF is essential…
The force field of optical tweezers is commonly assumed to be conservative, neglecting the complex action of the scattering force. Using a novel method that extracts local forces from trajectories of an optically trapped particle, we…
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement…
Spatially separated bodies in relative motion through vacuum experience a tiny friction force known as quantum friction. This force has so far eluded experimental detection due to its small magnitude and short range. Quantitative details…
Metrological AFM measurements are performed on the silica glass interfaces of photonic band-gap fibres and hollow capillaries. The freezing of attenuated out-of-equilibrium capillary waves during the drawing process is shown to result in a…
The atomic force microscope is a versatile tool that allows many routes to be used for investigating the mechanical properties of soft materials on the nanometer scale. In the present work, experiments were performed on polystyrene polymer…
This paper considers the analogy between the force exerted on cold atoms when they interact with a highly twisted tightly focused laser beam and the forces exerted on a charged dielectric particle inside a uniform electric field when we…
Theoretical frameworks used to qualitatively and quantitatively describe nuclear dynamics in solids are often based on the harmonic approximation. However, this approximation is known to become inaccurate or to break down completely in many…
Manipulation of metal nanoparticles using atomic force microscope is a promising new technique for probing tribological properties at the nanoscale. In spite of some advancements in experimental investigations, there is no unambiguous…
In this work, the force due to radiation pressure is measured with sub-10 pN sensitivity, corresponding to less than 2 mW of optical power. The apparatus adds homemade reflectors to a commercial Cavendish balance, which consists of a…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…
The Casimir-Lifshitz force is calculated between a heterogeneous gapped metal surface and a silica sphere attached to an AFM cantilever tip. We demonstrate that heterogeneous surface patches with different off-stoichiometry surface…
In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral…
In this study, with the help of the Arduino UNO and Load-cell force sensor, a simple experimental material has been developed to calculate kinetic and static friction coefficients and analyse the friction force in detail. The system with a…
We study the quantum dynamics of a model for the single-spin measurement in magnetic-resonance force microscopy. We consider an oscillating driven cantilever coupled with the magnetic moment of the sample. Then, the cantilever is damped…
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
We explain and demonstrate a new method of force- and position-calibration for optical tweezers with back-focal-plane photo detection. The method combines power spectral measurements of thermal motion and the response to a sinusoidal motion…