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Nearly all standard force fields employ the 'sum-of-spheres' approximation, which models intermolecular interactions purely in terms of interatomic distances. Nonetheless, atoms in molecules can have significantly non-spherical shapes,…

Atomic Physics · Physics 2018-07-20 Mary J. Van Vleet , Alston J. Misquitta , J. R. Schmidt

Using Atomic Force Microscopes (AFM) to manipulate nano-objects is an actual challenge for surface scientists. Basic haptic interfacesbetween the AFM and experimentalists have already been implemented. Themulti-sensory renderings (seeing,…

Graphics · Computer Science 2010-05-31 Sylvain Marliere , Daniela Urma , Jean-Loup Florens , Florence Marchi

Atomically-resolved imaging and force measurements using the atomic force microscope (AFM) are performed most commonly in a frequency-modulation (FM) mode. This has led to spectacular results, including direct observation of the atomic…

Mesoscale and Nanoscale Physics · Physics 2018-12-26 John E. Sader , Barry D. Hughes , Ferdinand Huber , Franz J. Giessibl

Numerous cell types relate to their immediate environment by exerting a three-dimensional pressure field on their environment, with components both longitudinal and transverse to the cell membrane. This pressure field can in principle be…

Soft Condensed Matter · Physics 2026-03-09 Quentin Bédel , Loïc Dupré , Nicolas Destainville

Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…

Biological Physics · Physics 2018-02-09 Stanislav Makarchuk , Nicolas Beyer , Christian Gaiddon , Wilfried Grange , Pascal Hébraud

We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…

Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…

Applied Physics · Physics 2018-09-06 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Peter Grutter

Differentiable physics is a powerful tool in computer vision and robotics for scene understanding and reasoning about interactions. Existing approaches have frequently been limited to objects with simple shape or shapes that are known in…

Computer Vision and Pattern Recognition · Computer Science 2022-01-11 Michael Strecke , Joerg Stueckler

Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise from the nanoscale structures and interactions of their…

Mesoscale and Nanoscale Physics · Physics 2023-08-01 Alba R. Piacenti , Casey Adam , Nicholas Hawkins , Ryan Wagner , Jacob Seifert , Yukinori Taniguchi , Roger Proksch , Sonia Contera

Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…

Mesoscale and Nanoscale Physics · Physics 2013-12-11 Fengzhen Zhang , Othmar Marti , Stefan Walheim , Thomas Schimmel

High-speed atomic force microscopy (HS-AFM) is an indispensable technique in the biological field owing to its excellent imaging capability for the real-time observation of biomolecules with high spatial resolution. Furthermore, recent…

Molecular dynamics simulations have been performed to understand true atomic resolution, which has been observed on the Si(111)-7$\times$7 surface by dynamic force microscopy in ultra high vacuum(UHV). Stable atomic-scale contrast is…

Materials Science · Physics 2009-10-31 Abduxukur Abdurixit , Alexis Baratoff , Ernest Meyer

The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some…

Mesoscale and Nanoscale Physics · Physics 2013-05-09 Justine Laurent , Audrey Steinberger , Ludovic Bellon

The quantitative interatomic force measurements open a new pathway to materials characterization, surface science, and chemistry by elucidating the force between 'two' interacting atoms as a function of their separation. Atomic force…

Applied Physics · Physics 2024-06-19 Omur E Dagdeviren

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…

Atomic and Molecular Clusters · Physics 2016-08-16 Gérard Couturier , Rodolphe Boisgard , Laurent Nony , Jean-Pierre Aimé

Fermi surfaces, three-dimensional (3D) abstract interfaces that define the occupied energies of electrons in a solid, are important for characterizing and predicting the thermal, electrical, magnetic, and optical properties of crystalline…

We present a theoretical study of the measurements of photoinduced force microscopy (PiFM) for composite molecular systems. Using the discrete dipole approximation, we calculate the self-consistent response electric field of the entire…

Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…

Instrumentation and Detectors · Physics 2017-04-05 H. Sadeghian , R. Herfst , B. Dekker , J. Winters , T. Bijnagte , R. Rijnbeek

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…

Materials Science · Physics 2016-08-14 F. Johann , Á. Hoffmann , E. Soergel
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