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The outstanding demonstration of quantum confinement in Si nanocrystals (Si NC) in a SiC matrix requires the fabrication of Si NC with a narrow size distribution. It is understood without controversy that this fabrication is a difficult…

Applied Physics · Physics 2020-05-18 C. Weiss , M. Schnabel , A. Reichert , P. Löper , S. Janz

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual…

Materials Science · Physics 2017-03-08 T. Susi , J. C. Meyer , J. Kotakoski

A combined experimental and numerical study on the variation of the elastic properties of defective single-crystal diamond is presented for the first time, by comparing nano-indentation measurements on MeV-ion-implanted samples with…

In the recent years graphitization of ion-beam induced amorphous layers became the basic tool for device fabrication in diamond. The etchable graphitic layers can be removed to form free-standing membranes into which the desired structures…

Materials Science · Physics 2016-08-26 S. Rubanov , B. A. Fairchild , A. Suvorova , P. Olivero , S. Prawer

Spincoated polystyrene films of different thickness from 78 nm to 1.3 {\mu}m on silicon wafers were treated by nitrogen ions with an energy of 20 keV. Ellipsometric measurements and FTIR spectra showed modification of the surface layer…

Chemical Physics · Physics 2025-03-27 Alexey Kondyurin

Effective mass anomalies due to the geometrical effects are investigated in silicon nanostructures using first-principles calculations for the first time. In \{111\} and \{110\} biaxially strained Si, it is found that longitudinal effective…

Materials Science · Physics 2015-06-25 Jun Yamauchi

Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing the frame rate is essential. Traditionally, maximum frame…

Applied Physics · Physics 2024-11-26 Kenichi Umeda , Noriyuki Kodera

Light-pulse atom interferometers serve as tools for high-precision metrology and are targeting measurements of relativistic effects. This development is facilitated by extended interrogation times and large-momentum-transfer techniques…

Quantum Physics · Physics 2025-05-06 Christian Niehof , Daniel Derr , Enno Giese

We present an ab-initio study of the hybridization of localized surface plasmons in a metal nanoparticle dimer. The atomic structure, which is often neglected in theoretical studies of quantum nanoplasmonics, has a strong impact on the…

In recent years it has become possible to study the properties of nanocrystalline metals through atomic-scale simulations of systems with realistic grain sizes. A brief overview of the main results is given, such as the observation of a…

Materials Science · Physics 2007-05-23 J. Schiøtz

Time-resolved atom interferometry, as employed in applications such as gravitational wave detection and searches for ultra-light dark matter, requires precise control over systematic effects. In this work, we investigate phase noise arising…

Atomic Physics · Physics 2025-11-25 Noam Mouelle , Jeremiah Mitchell , Valerie Gibson , Ulrich Schneider

From nanoscale devices including sensors, electronics, or biocompatible coatings to macroscale structural, automotive or aerospace components, fundamental understanding of plasticity and fracture can guide the realization of materials that…

Materials Science · Physics 2025-05-14 D. G. Sangiovanni , A. Kjellén , F. Trybel , L. J. S. Johnson , M. Odén , F. Tasnádi , I. A. Abrikosov

Scanning electron microscopy (SEM) imaging is able to visualize micro- to nano-structures of cement and concrete. A prerequisite is that the sample preparation preserves the native structure of the specimen. In this study, argon Broad Ion…

Materials Science · Physics 2021-09-10 Florian Kleiner , Christian Matthes , Christiane Rößler

Classical molecular-dynamics simulations have been carried out to investigate densification mechanisms in silicon dioxide thin films deposited on an amorphous silica surface, according to a simplified ion-beam assisted deposition (IBAD)…

Materials Science · Physics 2009-11-07 Alexis Lefevre , Laurent J. Lewis , Ludvik Martinu , Michael R. Wertheimer

Key circumstance of radical progress for technology of XXI century is the development of a technique which provides controllable producing three-dimensional patterns incorporating regions of nanometer sizes and required physical and…

The electromagnetic effect is studied on the short wavelength branch of the ion temperature gradient mode in the linear regime for the first time using a global gyrokinetic model. The short wavelength ion temperature gradient mode growth…

Plasma Physics · Physics 2020-05-27 M. Jagannath , J. Chowdhury , R. Ganesh , L. Villard

We investigate the structure of the [bmim][Tf2N]/silica interface by simulating the indentation of a thin (4 nm) [bmim][Tf2N] film by a hard nanometric tip. The ionic liquid/silica interface is represented in atomistic detail, while the tip…

Mesoscale and Nanoscale Physics · Physics 2017-08-23 P. Ballone , M. G. Del Pópolo , S. Bovio , A. Podestà , P. Milani , N. Manini

We present a theoretical study of Ge-core/Si-shell nanocrystals in a wide bandgap matrix and compare the results with experimental data obtained from the samples prepared by co-sputtering. The empirical tight-binding technique allows us to…

Mesoscale and Nanoscale Physics · Physics 2017-03-07 M. O. Nestoklon , A. N. Poddubny , P. Voisin , K. Dohnalova

Niobium nitride (NbN) is a metallic superconductor that is widely used for superconducting electronics due to its high transition temperature ($T_c$) and kinetic inductance. Processing-induced damage negatively affects the performance of…

Materials Science · Physics 2025-09-04 Azmain A. Hossain , Sela Murphy , David S. Catherall , Anthony J. Ardizzi , Austin J. Minnich

This article presents a numerical model dedicated to the simulation of field ion microscopy (FIM). FIM was the first technique to image individual atoms on the surface of a material. By a careful control of the field evaporation of the…