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Recent advances in detectors and computer science have enabled the acquisition and the processing of multidimensional datasets, in particular in the field of spectral imaging. Benefiting from these new developments, earth scientists try to…

Materials Science · Physics 2012-06-04 Nicolas Dobigeon , Nathalie Brun

Electron energy-loss spectroscopy (EELS) is a powerful tool for imaging chemical variations at the nanoscale. Here, we investigate a polymer/organic small molecule-blend used as absorber layer in an organic solar cell and employ EELS for…

Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively.…

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Mesoscale and Nanoscale Physics · Physics 2024-10-15 Benedikt Haas , Christoph T. Koch , Peter Rez

The performance of electron energy-loss spectrometers can often be limited by their electron-optical aberrations. Due to recent developments in high energy-resolution and momentum-resolved electron energy loss spectroscopy (EELS), there is…

Materials Science · Physics 2023-02-28 Yueming Guo , Andrew R. Lupini

In previous work a different and powerful, analytical, technique was used to get data, such as the absolute atom concentration (AAC), specimen thickness etc., from public domain boron nitride EELS spectrum collected under a collection…

Materials Science · Physics 2020-09-24 Noureddine Hadji

Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR spectroscopies but with atomic resolution and increased scattering cross sections. Recent advances in electron monochromators have expanded…

Chemical Physics · Physics 2024-04-26 Ye-Jin Kim , Levi D. Palmer , Wonseok Lee , Nicholas J. Heller , Scott K. Cushing

Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the…

Image and Video Processing · Electrical Eng. & Systems 2018-02-28 Étienne Monier , Thomas Oberlin , Nathalie Brun , Marcel Tencé , Marta de Frutos , Nicolas Dobigeon

Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…

Fine structure analysis of core electron excitation spectra is a cornerstone characterization technique across the physical sciences. Spectra are most commonly measured with synchrotron radiation and X-ray spot sizes on the {\mu}m to mm…

Hydrogenated amorphous carbon thin films (a:C-H) are very promising materials for numerous applications. The growing of relevance of a:C-H is mainly due to the long-term stability of their outstanding properties. For improving their…

Materials Science · Physics 2025-01-22 L. Lajaunie , C. Pardanaud , C. Martin , P. Puech , C. Hu , M. J. Biggs , R. Arenal

Low-loss electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) probes the valence electron density and relevant optoelectronic properties such as band gap energies and other band structure…

Materials Science · Physics 2018-11-20 Alberto Eljarrat , Christoph T. Koch

Low-loss electron energy loss spectroscopy (EELS) has emerged as a technique of choice for exploring the localization of plasmonic phenomena at the nanometer level, necessitating analysis of physical behaviors from 3D spectral data sets.…

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…

Image and Video Processing · Electrical Eng. & Systems 2020-02-05 Etienne Monier , Thomas Oberlin , Nathalie Brun , Xiaoyan Li , Marcel Tencé , Nicolas Dobigeon

We demonstrate the feasibility of coincidence measurements in a conventional transmission electron microscope, revealing the temporal correlation between electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX)…

Instrumentation and Detectors · Physics 2019-05-01 Daen Jannis , Knut Müller-Caspary , Armand Béché , Andreas Oelsner , Johan Verbeeck

In this paper convexity constraints are derived for a background model of electron energy loss spectra (EELS) that is linear in the fitting parameters. The model outperforms a power-law both on experimental and simulated backgrounds,…

Data Analysis, Statistics and Probability · Physics 2023-08-31 Wouter Van den Broek , Daen Jannis , Jo Verbeeck

Atomically resolved electron energy-loss spectroscopy experiments are commonplace in modern aberrationcorrected transmission electron microscopes. Energy resolution has also been increasing steadily with the continuous improvement of…

Materials Science · Physics 2014-03-10 R. Egoavil , N. Gauquelin , G. T. Martinez , S. Van Aert , G. Van Tendeloo , J. Verbeeck

Electron energy-loss spectroscopy (EELS) performed in transmission electron microscopes is shown to directly render the photonic local density of states (LDOS) with unprecedented spatial resolution, currently below the nanometer. Two…

Materials Science · Physics 2012-11-13 F. J. Garcia de Abajo , M. Kociak

The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher…

The ionization edges encoded in the electron energy loss spectroscopy (EELS) spectra enable advanced material analysis including composition analyses and elemental quantifications. The development of the parallel EELS instrument and fast,…

Materials Science · Physics 2022-09-28 Lingli Kong , Zhengran Ji , Huolin L. Xin
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