Related papers: Near-field spectroscopy of silicon dioxide thin fi…
Near-field infrared spectroscopy by elastic scattering of light from a probe tip resolves optical contrasts in materials at dramatically sub-wavelength scales across a broad energy range, with the demonstrated capacity for chemical…
We study plasmonic resonances in electrostatically gated graphene nanoribbons on silicon dioxide substrates. Absorption spectra are measured in the mid-far infrared and reveal multiple peaks, with width-dependent resonant frequencies. We…
We present combined experimental and numerical work on light-matter interactions at nanometer length scales. We report novel numerical simulations of near-field infrared nanospectroscopy that consider, for the first time, detailed tip…
We theoretically study resonance responses of flat surfaces and sharp edges of the nanostructures that support excitations of phonon-polaritons in mid-infrared range. We focus on two materials: silicon carbide that has a nearly isotropic…
We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially-resolved impedance…
Intermediate frequency range (511 - 514 cm-1) Si phonons in Si-SiO2 nanocomposites are shown to have contribution from both core1 and surface/interface1 Si phonons, where, ratio of contribution of the two depends on the size of a Si…
Thermal emission of localized surface phonons (LSPhs) from nanostructures of polaritonic materials is a promising mechanism for tuning the spectrum of near-field thermal radiation. Previous studies have theoretically shown that thermal…
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…
A theoretical study describing the coherence properties of near-field Raman scattering in two- and one-dimensional systems is presented. The model is applied to the Raman modes of pristine graphene and graphene edges. Our analysis is based…
We detect thermally excited surfaces waves on a submicron SiO 2 layer, including Zenneck and guided modes in addition to Surface Phonon Polaritons. The measurements show the existence of these hybrid thermal-electromagnetic waves from…
X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak shapes of elements under consideration. It is also possible…
We describe a simple and robust method using an internal reflection element acting as an infrared waveguide to measure the spectra of near-field thermal emission. We experimentally demonstrate the spectrally-narrow peaks of near-field…
The development of nanoscale solid-state devices exploiting the promising topological surface states of topological insulator materials requires careful device engineering and improved materials quality. For instance, the introduction of a…
We provide an analytical solution to study the near field optical effect of a core-shell nanostructure in proximity to a flat surface, within quasi-static approximation. The distribution of electrostatic potential and field enhancement in…
Silicon nitride thin films play an important role in the realization of sensors, filters, and high-performance circuits. Estimates of the dielectric function in the far- and mid-infrared regime are derived from the observed transmittance…
We present the intrinsic optical properties over a broad spectral range of TiN thin films deposited on a Si/SiO$_2$ substrate. We analyze the measured reflectivity spectra of the film-substrate multilayer structure within a well-establish…
We report spectral features of far infrared electromagnetic radiation absorption in anatase TiO2 nanopowders which we attribute to absorption by acoustic phonon modes of nanoparticles. The frequency of peak excess absorption above the…
Near-field enhanced, nano-Raman spectroscopy has been successfully used to probe the surface chemistry of silicon prepared using standard wafer cleaning and processing techniques. The results demonstrate the utility of this measurement for…
Scattering of phonons at boundaries of a crystal (grains, surfaces, or solid/solid interfaces) is characterized by the phonon wavelength, the angle of incidence, and the interface roughness, as historically evaluated using a specularity…
We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy…