Related papers: qPlus Magnetic Force Microscopy in Frequency-Modul…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup.…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
We review recent efforts to detect small numbers of nuclear spins using magnetic resonance force microscopy. Magnetic resonance force microscopy (MRFM) is a scanning probe technique that relies on the mechanical measurement of the weak…
The magnetic properties of arrays of nanowires (NWs) and nanotubes (NTs), 150 nm in diameter, electrodeposited inside nanoporous polycarbonate membranes are investigated. The comparison of the nanoscopic magnetic force microscopy (MFM)…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
We present Magnetic Resonance Force Microscopy (MRFM) measurements of Ferromagnetic Resonance (FMR) in a 50 nm thick permalloy film, tilted with respect to the direction of the external magnetic field. At small probe-sample distances the…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can…
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…
We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…
Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the relatively high displacement sensor noise density (n_{ds}),…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…
Recently synthesized magnetic multilayers with strong perpendicular anisotropy exhibit unique magnetic properties including the formation of specific multidomain states. In particular, antiferromagnetically coupled multilayers own rich…
The presence of a domain wall trapped by a sub-micron notch is probed in two ways: through electronic transport measurements and by Magnetic Force Microscopy (MFM). We observe complex magnetic features which are consistent with numerical…
Piezoresponse Force Microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…