Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

T. Jungk; A. Hoffmann; E. Soergel

doi:10.1063/1.2362984

Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

Materials Science 2016-08-31 v1

Authors: T. Jungk , A. Hoffmann , E. Soergel

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Abstract

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging.

Keywords

ferroelectric thin films

Cite

@article{arxiv.cond-mat/0510005,
  title  = {Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy},
  author = {T. Jungk and A. Hoffmann and E. Soergel},
  journal= {arXiv preprint arXiv:cond-mat/0510005},
  year   = {2016}
}

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